Wilson, P.
and Ma, M.
(1984),
Small Aperture Analysis of the Dual TEM Cell and anInvestigation of Test Object Scattering in a Single TEM Cell, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed December 14, 2024)
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Small Aperture Analysis of the Dual TEM Cell and anInvestigation of Test Object Scattering in a Single TEM Cell
Published
Author(s)
, M T. Ma
Citation
Technical Note (NIST TN) - 1076
Report Number
1076
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created September 30, 1984, Updated October 12, 2021