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Slip Correction Measurements of Certified PSL Nanoparticles Using a Nanometer Differential Mobility Analyzer (Nano-DMA) for Knudsen Number From 0.5 to 83.

Published

Author(s)

J H. Kim, George W. Mulholland, S R. Kukuck, D Y. Pui
Citation
Journal of Research of the National Institute of Standards and Technology
Volume
110
Issue
1

Citation

Kim, J. , Mulholland, G. , Kukuck, S. and Pui, D. (2005), Slip Correction Measurements of Certified PSL Nanoparticles Using a Nanometer Differential Mobility Analyzer (Nano-DMA) for Knudsen Number From 0.5 to 83., Journal of Research of the National Institute of Standards and Technology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=101133 (Accessed April 14, 2024)
Created November 30, 2005, Updated October 12, 2021