Kim, J.
, Mulholland, G.
, Kukuck, S.
and Pui, D.
(2005),
Slip Correction Measurements of Certified PSL Nanoparticles Using a Nanometer Differential Mobility Analyzer (Nano-DMA) for Knudsen Number From 0.5 to 83., Journal of Research of the National Institute of Standards and Technology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=101133
(Accessed December 13, 2024)
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Slip Correction Measurements of Certified PSL Nanoparticles Using a Nanometer Differential Mobility Analyzer (Nano-DMA) for Knudsen Number From 0.5 to 83.
Published
Author(s)
J H. Kim, , , D Y. Pui
Citation
Journal of Research of the National Institute of Standards and Technology
Volume
110
Issue
1
Pub Type
Journals
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Created November 30, 2005, Updated October 12, 2021