TY  - JOUR
AU  - J Kim
AU  - George Mulholland
AU  - S Kukuck
AU  - D Pui
C2  - Journal of Research of the National Institute of Standards and Technology
DA  - 2005-12-01 00:12:00
LA  - en
M1  - 110
PB  - Journal of Research of the National Institute of Standards and Technology
PY  - 2005
TI  - Slip Correction Measurements of Certified PSL Nanoparticles Using a Nanometer Differential Mobility Analyzer (Nano-DMA) for Knudsen Number From 0.5 to 83.
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=101133
ER  -