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In Situ Ultra-Small-Angle X-Ray Scattering From Dislocation Structures in Plastically Deformed Single-Crystal Aluminum
Published
Author(s)
Lyle E. Levine, Gabrielle G. Long
Abstract
Ultra-small-angle x-ray scattering data were obtained from a single-crystal Al sample deformed in situ at strains up to 18 %. High sensitivity to the resulting dislocation structure evolution was observed. The data are consistent with theoretical predictions, allowing quantitative microstructural parameters to be extracted.
Citation
Physical Review Letters
Pub Type
Journals
Keywords
dislocations, plastic deformation, small-angle scattering, work hardening
Levine, L.
and Long, G.
(2017),
In Situ Ultra-Small-Angle X-Ray Scattering From Dislocation Structures in Plastically Deformed Single-Crystal Aluminum, Physical Review Letters
(Accessed April 19, 2024)