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In Situ Ultra-Small-Angle X-Ray Scattering From Dislocation Structures in Plastically Deformed Single-Crystal Aluminum

Published

Author(s)

Lyle E. Levine, Gabrielle G. Long

Abstract

Ultra-small-angle x-ray scattering data were obtained from a single-crystal Al sample deformed in situ at strains up to 18 %. High sensitivity to the resulting dislocation structure evolution was observed. The data are consistent with theoretical predictions, allowing quantitative microstructural parameters to be extracted.
Citation
Physical Review Letters

Keywords

dislocations, plastic deformation, small-angle scattering, work hardening

Citation

Levine, L. and Long, G. (2017), In Situ Ultra-Small-Angle X-Ray Scattering From Dislocation Structures in Plastically Deformed Single-Crystal Aluminum, Physical Review Letters (Accessed April 23, 2024)
Created February 19, 2017