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In Situ and Ex Situ Spectroscopic Ellipsometry of Low-Temperature-Grown GaAs

Published

Author(s)

Donald A. Gajewski, Nhan Van Nguyen, Jonathan E. Guyer, Joseph Kopanski, Curt A. Richter, Joseph G. Pellegrino
Proceedings Title
2000 Electronic Materials Conference Program
Volume
29
Issue
7
Conference Dates
July 21-23, 2000
Conference Location
Denver, CO, USA
Conference Title
2000 Electronic Materials Conference

Citation

Gajewski, D. , Nguyen, N. , Guyer, J. , Kopanski, J. , Richter, C. and Pellegrino, J. (2000), In Situ and Ex Situ Spectroscopic Ellipsometry of Low-Temperature-Grown GaAs, 2000 Electronic Materials Conference Program, Denver, CO, USA (Accessed May 24, 2024)

Issues

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Created July 29, 2000, Updated October 12, 2021