Gajewski, D.
, Nguyen, N.
, Guyer, J.
, Kopanski, J.
, Richter, C.
and Pellegrino, J.
(2000),
In Situ and Ex Situ Spectroscopic Ellipsometry of Low-Temperature-Grown GaAs, 2000 Electronic Materials Conference Program, Denver, CO, USA
(Accessed April 29, 2024)
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In Situ and Ex Situ Spectroscopic Ellipsometry of Low-Temperature-Grown GaAs
Published
Author(s)
Donald A. Gajewski, , , , , Joseph G. Pellegrino
Proceedings Title
2000 Electronic Materials Conference Program
Volume
29
Issue
7
Conference Dates
July 21-23, 2000
Conference Location
Denver, CO, USA
Conference Title
2000 Electronic Materials Conference
Pub Type
Conferences
Citation
Created July 29, 2000, Updated October 12, 2021