Marchiando, J.
(1991),
Semiconductor Measurement Technology: A Software Program for Aiding the Analysis of Ellipsometric Measurements, Simple Spectroscopic Models, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed October 15, 2024)
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Semiconductor Measurement Technology: A Software Program for Aiding the Analysis of Ellipsometric Measurements, Simple Spectroscopic Models
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Special Publication (NIST SP) -
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Created April 30, 1991, Updated February 17, 2017