Publications

Displaying 1 - 3 of 3

Field Emission of Bulk Hexagonal Boron Nitride Via Extreme Ultraviolet Pulsed Atom Probe Tomography

July 27, 2026

Author(s)

Christopher Mead, Benjamin Caplins, Luis Miaja Avila, Ann Debay, James Edgar, Josh Avery

As modern transistors approach the atomic limit, the continued scaling of computational power has required significant efforts to develop next-generation device architectures at such small scales. 2D- materials, materials containing covalently bonded

Wavelength-Dependent Field Ion Emission in Atom Probe Tomography

July 27, 2026

Author(s)

Ann Debay, Benjamin Caplins, Karen DeRocher, Jacob Garcia, May Martin, Mark McLean, Christopher Mead, Luis Miaja Avila, William Osborn, Xiaochen Ren, Norman Sanford

Laser-pulsed atom probe tomography (APT) is a powerful tool for materials characterization due to its desirable combination of high spatial resolution and analytical sensitivity. In current state-of-the-art commercial APT instruments, near ultraviolet (NUV

Comparing Sub-Gap and Above-Gap Pulsed Radiation Sources for Measuring Oxygen Concentration in MgO Using Atom Probe Tomography

May 17, 2026

Author(s)

Ann Debay, Benjamin Caplins, Christopher Mead, Jacob Garcia, Luis Miaja Avila

This paper explores the experimental conditions required to achieve an apparent stoichiometric composition measurement in MgO using near ultraviolet (NUV; 355 nm) and extreme ultraviolet (EUV; ≈29 nm) pulsed laser sources in atom probe tomography. MgO

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