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Search Publications by: Jhih-Wei Chen (IntlAssoc)

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Impact of Measurement Setup on Cryogenic CMOS FET Characterization

March 31, 2026
Author(s)
Pragya Shrestha, Jason Campbell, Jhih-Wei Chen, Mau-Chung Frank Chang
Accurate cryogenic device characterization is essential for developing compact models to support scalable quantum control electronics based on advanced CMOS nodes. However, we show that abnormal I–V characteristics observed in 16 nm and 28 nm devices at
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