August 21, 2025
Author(s)
Amirhossein Zahmatkeshsaredorahi, Ruben Millan-Solsona, Devon Jakob, Liam Collins, Xiaoji Xu
Kelvin Probe Force Microscopy (KPFM), a technique derived from Atomic Force Microscopy (AFM), provides nanometer-scale spatial resolution for mapping surface potential or work function differences across material systems. It serves as a powerful tool for