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Search Publications by: Ben Jamroz (Fed)

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Displaying 26 - 29 of 29

A Systematic Study: Channel Sounding via Modal Expansion

November 3, 2018
Author(s)
Alex Yuffa, Ben Jamroz, Jake Rezac, Dylan Williams
We present preliminary results of using a modal (partial wave) expansion of the field to characterize a propagation channel. We assume that the measurements of the scalar, two-dimensional field from which the modal expansion coefficients are obtained

On-Wafer Transistor Characterization to 750 GHz -the approach, results, and pitfalls

October 14, 2018
Author(s)
Dylan Williams, Jerome Cheron, Ben Jamroz, Richard Chamberlin
We review approaches developed at the National Institute of Standards and Technology for on-wafer transistor characterization and model extraction at sub-millimeter-wave wavelengths, and compare them to more common approaches developed for use at lower

A Self-Calibrated Transfer Standard for Microwave Calorimetry

July 8, 2018
Author(s)
Dazhen Gu, Xifeng Lu, Ben Jamroz, Dylan Williams, Billy F. Riddle, Xiaohai Cui
We develop a new calibration technique for measuring the correction factor of a calorimeter with a vector network analyzer. Based on a wave-parameter formulation, we develop analytic formulas for the correction-factor ($g$) and effective-efficiency ($\eta$

Importance of Preserving Correlations in Error-Vector-MagnitudeUncertainty

June 14, 2018
Author(s)
Ben Jamroz, Dylan Williams, Kate Remley, Rob Horansky
Correlations are an important consideration in the uncertainty analysis of high-frequency electronic systems. We introduce a method to scramble the correlations of a correlated uncertainty analysis and develop a software tool to do this as part of the NIST
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