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Search Publications by: Michael Mengason (Fed)

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Displaying 1 - 4 of 4

Diffusion in the Ti-Al-V system

August 23, 2018
Author(s)
Greta Lindwall, Kil-Won Moon, Zhangqi Chen, Michael J. Mengason, Maureen E. Williams, Justin Gorham, Ji-Cheng Zhao, Carelyn E. Campbell
Diffusion in the Ti-Al-V system is studied and a CΑLPHAD diffusion mobility description is developed. Diffusion couple experiments are used to obtain information of Al and V diffusion in the α phase. This includes diffusion paths at the temperatures 923 K

EDS Microanalysis: Pushing the Limits

June 1, 2018
Author(s)
Nicholas Ritchie, Dale E. Newbury, Michael J. Mengason, Heather Lowers
It is a great time to be a microanalyst. After a few decades of incremental progress in energy dispersive X-ray spectrometry (EDS), the last decade has seen the accuracy and precision surge forward. Today, the question is not whether EDS is generally

SEM/EDS Trace Analysis: Limits Imposed by Fluorescence of the Detector

August 4, 2017
Author(s)
Dale E. Newbury, Nicholas W. Ritchie, Michael J. Mengason, Keana C. Scott
Elemental trace analysis by electron-excited x-ray spectrometry performed in the scanning electron microscope (SEM) with energy dispersive x-ray spectrometry (EDS) can reach a limit of detection of 0.0005 mass fraction for many elements. Exceptions include