Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Michael Mengason (Fed)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 1 - 6 of 6

Pyrrhotite Reference Material Synthesis

April 4, 2025
Author(s)
Michael Mengason, Stephanie Watson
The mineral pyrrhotite was synthesized from iron and sulfur starting materials for one component in a four-component reference material (RM 8154-Pyrrhotite in Concrete) to be used to evaluate the presence of sulfur in aggregate (crushed rock) and concrete

Diffusion in the Ti-Al-V system

August 23, 2018
Author(s)
Greta Lindwall, Kil-Won Moon, Zhangqi Chen, Michael J. Mengason, Maureen E. Williams, Justin Gorham, Ji-Cheng Zhao, Carelyn E. Campbell
Diffusion in the Ti-Al-V system is studied and a CΑLPHAD diffusion mobility description is developed. Diffusion couple experiments are used to obtain information of Al and V diffusion in the α phase. This includes diffusion paths at the temperatures 923 K

EDS Microanalysis: Pushing the Limits

June 1, 2018
Author(s)
Nicholas Ritchie, Dale E. Newbury, Michael Mengason, Heather Lowers
It is a great time to be a microanalyst. After a few decades of incremental progress in energy dispersive X-ray spectrometry (EDS), the last decade has seen the accuracy and precision surge forward. Today, the question is not whether EDS is generally

SEM/EDS Trace Analysis: Limits Imposed by Fluorescence of the Detector

August 4, 2017
Author(s)
Dale E. Newbury, Nicholas W. Ritchie, Michael J. Mengason, Keana C. Scott
Elemental trace analysis by electron-excited x-ray spectrometry performed in the scanning electron microscope (SEM) with energy dispersive x-ray spectrometry (EDS) can reach a limit of detection of 0.0005 mass fraction for many elements. Exceptions include
Was this page helpful?