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Search Publications by: Andrew Dienstfrey (Fed)

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Displaying 51 - 75 of 108

Analysis for Dynamic Metrology

January 30, 2014
Author(s)
Andrew M. Dienstfrey, Paul D. Hale
Diverse measurement contexts require estimates of time varying quantities. Ideally the measurement device responds to signal variations significantly more rapidly than the modulation of the signal itself. If so, then well-developed techniques may be used

A New Metric for Latent Fingerprint Image Preprocessing

June 23, 2013
Author(s)
Mary Frances Theofanos, Andrew Dienstfrey, Brian Stanton, Haiying Guan
Although fingerprint recognition is a well-studied area, forensic fingerprint preprocessing based on computational theory is still a relatively new domain in need of further scientific study and development of standards of best practice. Latent fingerprint

Preface

September 2, 2012
Author(s)
Andrew M. Dienstfrey, Ronald F. Boisvert

Traceability of high-speed electrical waveforms at NIST, NPL, and PTB

July 6, 2012
Author(s)
Paul D. Hale, Dylan F. Williams, Andrew M. Dienstfrey, Chih-Ming Wang, Jeffrey A. Jargon, David Humphreys, Matthew Harper, Heiko Fuser, Mark Bieler
Instruments for measuring high-speed waveforms typically require calibration to obtain accurate results. The national metrology institutes of the United States of America, the United Kingdom, and Germany offer measurement services based on electro-optic

A statistical study of de-embedding applied to eye diagram analysis

February 1, 2012
Author(s)
Paul D. Hale, Jeffrey A. Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M. Dienstfrey, Dylan F. Williams
We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any

Why are we concerned with large covariance matrices?

June 1, 2010
Author(s)
Paul D. Hale, Andrew M. Dienstfrey, Chih-Ming Wang
In order to promote discussion, we outline the two different paradigms for propagating uncertainties from the various waveform measurement impairments to the waveform parameters. The first method propagates uncertainty from the impairments directly to a

Waveform metrology and a quantitative study of regularized deconvolution

May 1, 2010
Author(s)
Paul D. Hale, Andrew M. Dienstfrey
We present methodology and preliminary results of a Monte-Carlo simulation to perform a quantified analysis of regularized deconvolution in the context of full waveform metrology. We analyze the behavior of different regularized inversion methods with

A Discussion on the Interpretation and Characterization of Metafilms/Metasurfaces: The Two-Dimensional Equivalent of Metamaterials

October 1, 2009
Author(s)
Christopher L. Holloway, Andrew M. Dienstfrey, Edward E. Kuester, John F. O'Hara, Abul K. Azad
A metafilm is the surface equivalent of a metamaterial. More precisely, a metafilm is a surface distribution of suitably chosen electrically small scatterers. Metafilms are becoming popular as an alternative to the full three-dimensional metamaterials

Traceable waveform calibration with a covariance-based uncertainty analysis

October 1, 2009
Author(s)
Paul D. Hale, Dylan F. Williams, Andrew M. Dienstfrey, Arkadiusz C. Lewandowski, Tracy S. Clement, Darryl A. Keenan
We describe a method for calibrating the voltage that a step-like pulse generator produces at a load at every time point in themeasured waveform. The calibration includes an equivalent-circuit model of the generator that can be used to determine how the