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Search Publications by: Nicholas Ritchie (Fed)

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Displaying 26 - 38 of 38

Microscopy and Microanalysis of Individual Collected Particles- Chapter 10

July 5, 2011
Author(s)
Robert A. Fletcher, Nicholas W. Ritchie, Ian M. Anderson, John A. Small
This chapter describes microscopy and microanalysis techniques used for the characterization of collected, individual particles in a variety of instruments. The instruments discussed are the light microscope, electron microscopes (both scanning and

Bridging the Micro to Macro Gap: A New Application for Milli-probe X-ray Fluorescence

June 1, 2011
Author(s)
Jeffrey M. Davis, Dale E. Newbury, Nicholas W. Ritchie, Edward P. Vicenzi, Dale P. Bentz, Albert J. Fahey
X-ray elemental mapping and x-ray spectrum imaging are powerful microanalytical tools. However, their scope is limited spatially by the raster area of a scanning electron microscope or microprobe. Limited sampling size becomes a significant issue when

Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)

February 1, 2010
Author(s)
Ryna B. Marinenko, Shirley Turner, David S. Simons, Savelas A. Rabb, Rolf L. Zeisler, Lee L. Yu, Dale E. Newbury, Rick L. Paul, Nicholas W. Ritchie, Stefan D. Leigh, Michael R. Winchester, Lee J. Richter, Douglas C. Meier, Keana C. Scott, D Klinedinst, John A. Small
Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materials needed by the

Spectrum Simulation in DTSA-II

October 1, 2009
Author(s)
Nicholas W. Ritchie
Spectrum simulation is a useful practical and pedagogical tool. Particularly with complex samples or trace constituents, a simulation can help to understand the limits of the technique and how to optimize the tools for the optimal measurement. DTSA-II

Embracing Uncertainty: Modeling Uncertainty in EPMA - Part II

January 1, 2001
Author(s)
Nicholas Ritchie
This, the second in a series of articles present a new framework for considering the computation of uncertainty in electron excited X-ray microanalysis measurements, will discuss matrix correction. The framework presented in the first article will be

Reproducible Spectral and Hyper-Spectral Analysis using NeXL

January 1, 2001
Author(s)
Nicholas Ritchie
NeXL is a collection of Julia language packages (libraries) for X-ray microanalysis data processing. NeXLCore provides basic atomic and X-ray physics data and models including support for microanalysis-related data types for materials and k-ratios

Strategies for Standardizing EDS Measurements

January 1, 2001
Author(s)
Nicholas Ritchie
Energy dispersive X-ray spectrometers (EDS) are capable of precise and accurate electron beam measurements of composition. However, the optimal strategies for acquiring EDS standards differ from its wavelength dispersive cousin. There is a lot more