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Search Publications by: Aaron M. Forster (Fed)

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Displaying 76 - 82 of 82

High-Throughput Adhesion Testing of Combinatorial Libraries With Multi-Lens Arrays

February 1, 2004
Author(s)
Aaron M. Forster, Wenhua Zhang, Christopher Stafford
The NIST Combinatorial Methods Center (NCMC) has adapted the Johnson, Kendall, and Roberts (JKR) test to develop a high-throughput adhesion measurement platform. Traditionally, the JKR test utilizes a single hemispherical lens compressed against (loading)

Combinatorial Approach to Characterizing Epoxy Curing

January 1, 2004
Author(s)
Naomi Eidelman, D T. Raghavan, Aaron M. Forster, Eric J. Amis, Alamgir Karim
Three complementary techniques were used to follow the curing of a diglycidyl ether bisphenol A epoxy resin (DGEBA): FT-IR microspectroscopy, confocal microscopy, and axisymmetric adhesion testing. Each technique probes different characteristics of the

High-Throughput Measurements of Polymer Adhesion and Mechanical Properties

September 1, 2003
Author(s)
Christopher Stafford, Aaron M. Forster, C Harrison, Cher H. Davis, Eric J. Amis, Alamgir Karim
Polymer adhesion is important to numerous technologies including electronic packaging, coatings and paints, biomedical implants, and pressure-sensitive adhesives. The challenge is to understand the fundamental driving forces for the development of adhesive

Polymer Science at the NIST Combinatorial Methods Center

August 1, 2002
Author(s)
Cher H. Davis, Kathryn L. Beers, Aaron M. Forster, Christopher M. Stafford, A P. Smith, C Harrison, Weiping Zhang, Alamgir Karim, Eric J. Amis
The measurements, standards, and test methods developed by NIST, in partnership with other organizations, often help unlock the potential of new discoveries and budding technologies. Combinatorial methods are a textbook example. These emerging tools can
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