Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Andrew C.E. Reid (Fed)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 1 - 10 of 10

Calculating Voxel-Polyhedron Intersections for Meshing Images

October 9, 2021
Author(s)
Stephen A. Langer, Andrew C.E. Reid
Finite element meshes constructed from 3D images are useful in materials science and medical applications when it is necessary to model the actual geometry of a sample, rather than an idealized approximation of it. Constructing the mesh involves computing

The joint automated repository for various integrated simulations (JARVIS) for data-driven materials design

November 12, 2020
Author(s)
Kamal Choudhary, Kevin Garrity, Andrew C. Reid, Brian DeCost, Adam Biacchi, Angela R. Hight Walker, Zachary Trautt, Jason Hattrick-Simpers, Aaron Kusne, Andrea Centrone, Albert Davydov, Francesca Tavazza, Jie Jiang, Ruth Pachter, Gowoon Cheon, Evan Reed, Ankit Agrawal, Xiaofeng Qian, Vinit Sharma, Houlong Zhuang, Sergei Kalinin, Ghanshyam Pilania, Pinar Acar, Subhasish Mandal, David Vanderbilt, Karin Rabe
The Joint Automated Repository for Various Integrated Simulations (JARVIS) is an integrated infrastructure to accelerate materials discovery and design using density functional theory (DFT), classical force-fields (FF), and machine learning (ML) techniques

Learning to predict crystal plasticity at the nanoscale: Deep residual networks and size effects in uniaxial compression discrete dislocation simulations

May 19, 2020
Author(s)
Zijiang Yang, Stefanos Papanikolaou, Andrew C. Reid, Wei-keng Lao, Alok Choudhary, Carelyn E. Campbell, Ankit Agrawal
The increase of dislocation density in a metallic crystal undergoing plastic deformation influences the mechanical properties of the material. This effect can be used to examine the related inverse problem of deducing the prior deformation of a material

Spatial strain correlations, machine learning, and deformation history in crystal plasticity

May 16, 2019
Author(s)
Andrew C. Reid, Stefanos Papanikolaou, Hengxu Song, Erik Van der Giessen, Stephen A. Langer, Michail Tzimas
Digital image correlation (DIC) is a well-established, non-invasive technique for tracking and quantifying the deformation of mechanical samples under test. While it provides an obvious way to observe incremental and aggregate displacement information, it

Computational screening of high-performance optoelectronic materials using OptB88vdW and TB-mBJ formalisms

May 8, 2018
Author(s)
Kamal Choudhary, Qin Zhang, Sugata Chowdhury, Nhan V. Nguyen, Zachary T. Trautt, Marcus W. Newrock, Faical Y. Congo, Andrew C. Reid, Francesca M. Tavazza
We perform high-throughput density functional theory (DFT) calculations for optoelectronic properties (electronic bandgap and frequency dependent dielectric function) using the OptB88vdW functional (OPT) and the Tran-Blaha modified Becke Johnson potential

gtklogger: A Tool For Systematically Testing Graphical User Interfaces

August 20, 2015
Author(s)
Stephen A. Langer, Faical Y. Congo, Andrew C. Reid, Rhonald Lua, Valerie R. Coffman
We describe a scheme for systematically testing the operation of a graphical user interface. The scheme provides a capability for generating event logs, which are recordings of a user session with the interface. These logs can be annotated with assertion

OOF3D: An Image-Based Finite Element Solver for Materials Science

March 28, 2012
Author(s)
Valerie R. Coffman, Andrew C. Reid, Stephen A. Langer, Gunay Dogan
Recent advances in experimental techniques (micro CT scans, automated serial sectioning, electron back-scatter diffraction, synchrotron radiation x-rays) have made it possible to characterize the full, three dimensional structure of real materials. Such

Modeling Microstructures with OOF2

September 1, 2009
Author(s)
Andrew C. Reid, Rhonald Lua, R E. Garcia, Valerie R. Coffman, Stephen A. Langer
OOF2 is a program for computing the properties and behavior of material microstructures, beginning with an image of the microstructural geometry. OOF2 uses finite elements, but is designed to be used by materials scientists with little or no finite element