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Search Publications by: Ya-Shian Li-Baboud (Fed)

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Displaying 76 - 77 of 77

Semiconductor Factory and Equipment Time Synchronization

February 25, 2004
Author(s)
Ya-Shian Li-Baboud, Brad Van Eck
With the advent of e-manufacturing including automated process control (APC), such as fault detection classification (FDC), more stringent accuracy requirements for time stamps are required to perform analysis intended for process and business critical
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