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Search Publications by Bruce D. Ravel

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Displaying 1 - 25 of 28

Non-Resonant Valence-to-Core X-ray Emission Spectroscopy of Niobium

Bruce D. Ravel, A. J. Kropf, Dali Yang, Mengen Wang, Mehmet Topsokal, Deyu Lu, M. C. Stennett, N. C. Hyatt
The valence-to-core (V2C) portion of X-ray Emission Spectroscopy (XES) measures the electron 15 states close to the Fermi level. These states are involved in

Ultrafast time-resolved x-ray absorption spectroscopy of ferrioxalate photolysis with a laser plasma x-ray source and microcalorimeter array

Galen C. O'Neil, Joel N. Ullom, Luis Miaja Avila, Young Il Joe, Joseph W. Fowler, Carl D. Reintsema, Daniel S. Swetz, Kevin L. Silverman, Daniel R. Schmidt, Bruce D. Ravel, Gene C. Hilton, William B. Doriese, Bradley K. Alpert, Ralph Jimenez
Using a table-top apparatus based upon a laser plasma x-ray source and an array of cryogenic microcalorimeter x-ray detectors, we have measured the transient x

Abiotic bromination of soil organic matter

Bruce D. Ravel, Alessandra C. Leri
Biogeochemical transformations of plant-derived soil organic matter (SOM) involve complex abiotic and microbially mediated reactions. One such reaction is

Tomography of Integrated Circuit Interconnects

Zachary H. Levine, A R. Kalukin, M Kuhn, S P. Frigo, I McNulty, C C. Retsch, Y Wang, Uwe Arp, Thomas B. Lucatorto, Bruce D. Ravel, Charles S. Tarrio
00 Word summary based on the paper:Z. H. Levine, A. R. Kalukin, M. Kuhn, S. P. Frigo, I. McNulty,>C. C. Retsch, Y. Wang, U. Arp, T. B. Lucatorto, B. D. Ravel

Tomography of Integrated Circuit Interconnect With an Electromigration Void

Zachary H. Levine, A R. Kalukin, M Kuhn, S P. Frigo, I McNulty, C C. Retsch, Y Wang, Uwe Arp, Thomas B. Lucatorto, Bruce D. Ravel, Charles S. Tarrio
An integrated circuit interconnect was subject to accelerated-life conditions to induce an electromigration void. The silicon substrate was removed, leaving

The Local Structure of Ferroelectric Pb1-xGexTe

Bruce D. Ravel, Eric J. Cockayne, K M. Rabe
The narrow band-gap semiconductor Pb_{1-x}Ge_xTe has a low-temperature ferroelectric rhombohedral phase whose average structure is a distorted rock salt

Diffraction Anomalous Fine Structure Study of Strained GA1-xInxAs on GaAs(001)

Joseph C. Woicik, J O. Cross, Charles E. Bouldin, Bruce D. Ravel, J G. Pellegrino, B W. Steiner, S G. Bompadre, L B. Sorensen, K E. Miyano, J P. Kirkland
Diffraction anomalous fine-structure measurements performed at both the Ga and As K edges have determined the Ga-As bond length to be 2.442 ± 0.005 {Angstrom}