June 1, 2004
      
                  
        
  Author(s)
  John G. Gillen,   Cynthia J. Zeissler,   Christine M. Mahoney,   Abigail P. Lindstrom,   Robert A. Fletcher,   P  Chi,   Jennifer R. Verkouteren,   David S. Bright,   R  Lareau,   M  Boldman
 
       
            
    
    
        Cluster primary ion bombardment combined with secondary ion imaging is used in an ion microscope secondary ion mass spectrometer for the spatially resolved analysis of organic particles on various surfaces. Compared to the use of monoatomic primary ion