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Search Publications by: David W. Allen (Fed)

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Displaying 126 - 150 of 168

Calibration and Characterization of Trap Detector Filter Radiometers

November 1, 2003
Author(s)
David W. Allen, George P. Eppeldauer, Steven W. Brown, E A. Early, Bettye C. Johnson, Keith R. Lykke
We describe the development of a mechanically simple, radiometrically stable transfer radiometer designed for both radiance and irradiance measurements. The filter radiometer consists of a six-element Si trap detector, a temperature stabilized filter wheel

Temperature Scales Using Radiation Thermometers Calibratied From Absolute Irradiance and Radiance Responsivity

August 21, 2003
Author(s)
Howard W. Yoon, David W. Allen, Charles E. Gibson, Robert D. Saunders, Bettye C. Johnson, Steven W. Brown, Keith R. Lykke
In the International Temperature Scale of 1990 (ITS-90), temperatures above the freezing temperature of silver are defined with radiation thermometers calibrated using spectral radiance ratios to one of the silver-, gold- or copper-freezing temperature

Wafer Emissivity Effects on Light Pipe Radiometry in RTP Tools

May 1, 2002
Author(s)
Kenneth G. Kreider, David W. Allen, D H. Chen, D P. DeWitt, Christopher W. Meyer, Benjamin K. Tsai
We investigated the effect of different wafer emissivities and the effect of low emissivity films on RTP wafer temperature measurements using light pipe radiation thermometers (LPRTs). These tests were performed in the NIST RTP test bed. We used a NIST

Radiometric Calibration of the Scripps Earth Polychromatic Imaging Camera

January 1, 2002
Author(s)
E A. Early, B C. Bush, Steven W. Brown, David W. Allen, Bettye C. Johnson
As part of the Triana mission, the Scripps Earth Polychromatic Imaging Camera (Scripps-EPIC) will view the full sunlit side of Earth from the Lagrange-1 point. The National Institute of Standards and Technology and the Scripps Institution of Oceanography

Effects of Wafer Emissivity on Light-Pipe Rediometry in RTP Tools

September 1, 2001
Author(s)
Kenneth G. Kreider, David W. Allen, D H. Chen, D P. DeWitt, Christopher W. Meyer, Benjamin K. Tsai
We investigated the effect of different wafer emissivities and the effect of low emissivity films on rapid thermal processing (RTP) wafer temperature measurements using lightpipe radiation thermometers (LPRTs). These tests were performed in the NIST RTP