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Search Publications by: William E. Luecke (Assoc)

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Displaying 51 - 52 of 52

Sources of Strain-Measurement Error in Flag-Based Extensometry

June 1, 1996
Author(s)
William E. Luecke, J French
This paper examines the sources of error in strain measurement using flag-based extensometry that uses either scanning laser or electrooptical extensometers, These errors fall into two groups: errors in measuring the true gauge length of the specimen

CAVITATION CONTRIBUTES SUBSTANTIALLY TO TENSILE CREEP IN SILICON NITRIDE

August 1, 1995
Author(s)
William E. Luecke, Sheldon M. Wiederhorn, B Hockey, Ralph Krause, Gabrielle G. Long
During tensile creep of a hot isostatically pressed (HIPed) silicon nitride, the volume fraction of cavities increases linearly with strain; these cavities produce nearly all of the measured strain. In contrast, compressive creep in the same stress and
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