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Search Publications by: Dale E. Newbury (Assoc)

Displaying 101 - 112 of 112

High-Energy-Resolution Microcalorimeter Spectrometer for EDS X-Ray Microanalysis

December 1, 1997

Author(s)

D A. Wollman, G C. Hilton, K D. Irwin, L L. Dulcie, Dale E. Newbury, J M. Martinis

High-Resolution, Energy-Dispersive Microcalorimeter Spectrometer for X-Ray Microanalysis

December 1, 1997

Author(s)

David A. Wollman, Kent D. Irwin, Gene C. Hilton, L L. Dulcie, Dale E. Newbury, John M. Martinis

We have developed a prototype X‐ray microcalorimeter spectrometer with high energy resolution for use in X‐ray microanalysis. The microcalorimeter spectrometer system consists of a superconducting transition‐edge sensor X‐ray microcalorimeter cooled to an

Low Beam Energy X-Ray Microanalysis: How Useful is it?

December 1, 1997

Author(s)

Dale E. Newbury

High-Energy-Resolution Microcalorimeter Spectrometer for EDS X-Ray Microanalysis

August 1, 1997

Author(s)

David A. Wollman, Gene C. Hilton, Kent D. Irwin, L L. Dulcie, Dale E. Newbury, John M. Martinis

High-Resolution, Energy-Dispersive Microcalorimeter Spectrometer for X-Ray Microanalysis

February 19, 1997

Author(s)

D A. Wollman, Kent D. Irwin, Gene C. Hilton, L L. Dulcie, Dale E. Newbury, John M. Martinis

Imaging Deep Holes in Structures with Gaseous Secondary Electron Detection in the Environmental Scanning Electron Microscope

December 1, 1996

Author(s)

Dale E. Newbury

Intensity Measurement of Wavelength Dispersive X-Ray Emission Bands: Applications to the Soft X-Ray Region

December 1, 1996

Author(s)

G Redmond, C Gilles, M Fialin, O Rouer, Ryna B. Marinenko, Robert L. Myklebust, Dale Newbury

Compositional Changes in Aluminum-Lithium-Base Alloys Caused by Oxidation

January 1, 1993

Author(s)

K K. Soni, D. V. Williams, Dale Newbury, J Greg Gillen, P. Chi, David S. Bright

DEVELOPMENT OF NATIONAL BUREAU OF STANDARDS THIN GLASS-FILMS FOR X-RAY-FLUORESCENCE SPECTROMETRY

May 1, 1986

Author(s)

P A. Pella, Dale E. Newbury, Eric B. Steel, Douglas H. Blackburn

Electron-Excited Energy Dispersive X-ray Spectrometry in the Variable Pressure Scanning Electron Microscope (EDS/VPSEM): Its Not Microanalysis Anymore!

Author(s)

Dale E. Newbury, Nicholas W. Ritchie

X-ray spectra measured in the variable-pressure scanning electron microscope (VPSEM, chamber pressure 1 to 2500 Pa) suffer significantly degraded spatial resolution compared to high-vacuum SEM (operating pressure 0.1 mass fraction), minor (0.01≤ C ≤ 0.1)