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Search Publications by: John D. Fassett (Assoc)

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Displaying 1 - 16 of 16

MULTI-COLLECTOR CONFIGURATION CONSIDERATIONS AND SUBSTRATE RELATIVE SENSITIVITY FACTOR EFFECTS FOR AGE-DATING MEASUREMENTS OF PARTICLES BY LARGE GEOMETRY SECONDARY ION MASS SPECTROMETRY

October 1, 2021
Author(s)
Todd Williamson, David S. Simons, John D. Fassett
Chronometry (a.k.a age-dating, AD) of materials by bulk mass spectrometric methods is a well-established technique based on analysis protocols that have been used in geological fields and by the non-proliferation communities for many years. Recently, it

Measurement of Uranium-236 in Particles by Secondary Ion Mass Spectrometry

January 12, 2017
Author(s)
David S. Simons, John D. Fassett
The determination of the relative isotopic abundance by secondary ion mass spectrometry of 236U in uranium-containing material is complicated by the presence of 235U1H+ ions at the same nominal mass as the uranium isotopic peak. The net intensity of the

Uranium Ion Yields from Monodisperse Uranium Oxide Particles

February 24, 2016
Author(s)
Nicholas E. Sharp, John D. Fassett, David S. Simons
Secondary ion mass spectrometry (SIMS) plays an important role in nuclear forensics through its ability to identify isotopic ratios of particles accurately and precisely from samples obtained by inspectors [1]. As the particle mass can be on the order of

Detection Limit of Isotope Dilution Mass Spectrometry

August 1, 2002
Author(s)
Lee L. Yu, John D. Fassett, William F. Guthrie
The detection limit is an important figure of merit for evaluating instrumentation and analytical methods. While the detection limit for techniques using linear calibration functions has been studied extensively, this fundamental metric has rarely been

Definitions of Terms and Modes Used at NIST for Value-Assignment of Reference Materials for Chemical Measurements

January 1, 2000
Author(s)
Willie E. May, Reenie M. Parris, C M. Beck, John D. Fassett, Robert R. Greenberg, Franklin R. Guenther, Gary W. Kramer, Stephen Wise, T E. Gills, Jennifer C. Colbert, R J. Gettings, Bruce S. MacDonald
Standard Reference Materials (SRMs) are certified reference materials (CRMs) issued by NIST that are well-characterized using state-of-the-art measurement methods and/or techniques for the determination of chemical compositon and physical properties. SRMs