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Displaying 2076 - 2100 of 2183

Automated Calibration of Scanning Probe Microscopy by Image Processing

January 1, 1995
Author(s)
J Jorgensen
The continuing drive within high technology industries to push dimensional tolerances to still smaller values motivates the use of surface measuring techniques with better resolution. This requirement can be met by the scanning probe microscopy (SPM)

Calibration Uncertainties for Microform of Rockwell Hardness Indenters

January 1, 1995
Author(s)
F Rudder, Jun-Feng Song
A microform calibration procedure has been developed at NIST to certify geometric conformity of Rockwell C hardness indenters. The interest in microform calibrations is to unify national and international comparisons of hardness tests. Using accepted

Computer Modeling of Heterodyne Interferometer Errors

January 1, 1995
Author(s)
Lowell P. Howard, Jack A. Stone Jr.
A computer model and methodology for modeling optical mixing errors in heterodyne interferometers is presented. The model is based on the Jones calculus and uses a matrix formalism to eliminate simplifications and reduce assumptions in the model. The model

Enhanced Machinability of Silicon Carbide via Microstructural Design

January 1, 1995
Author(s)
Nitin P. Padture, Christopher J. Evans, Hockin D. Xu, Brian R. Lawn
The machinability of a heterogeneous silicon carbide with weak interphase boundaries, elongated grains, and high internal stresses is evaluated relative to a homogeneous control material with a well-bonded, equiaxed, and unstressed grain structure

Error Compensation for CMM Touch Trigger Probes

January 1, 1995
Author(s)
William T. Estler, Steven D. Phillips, Bruce R. Borchardt, Ted Hopp, Christoph J. Witzgall, M Levenson, et al
We present the analysis of a simple mechanical model of a common type of kinematic seat touch trigger probe widely used on modem coordinate measuring machines (CMMs). The model provides a quantitative description of the pre-travel variation or probe lobing

Fabrication of Optics by Diamond Turning

January 1, 1995
Author(s)
Richard L. Rhorer, Christopher J. Evans
The use of special machine tools with single-crystal diamond-cutting tools to produce metal optics is called diamond turning. The manufacture of optical surfaces by diamond turning is relatively new compared to the traditional optical-polishing methods. In

Measurement and Analysis of Forces in Grinding of Silicon Nitride

January 1, 1995
Author(s)
S Jahanmir, T W. Hwang, Eric P. Whitenton, S Job, Christopher J. Evans
Using an instrumented surface grinder, the two components of grinding forces (normal and tangential) were measured for different types of silicon nitride ceramics. The influences of grinding parameters, such as down feed and table speed, and grinding

Measurement of Patterned Film Linewidth for Interconnect Characterization

January 1, 1995
Author(s)
L Linholm, Robert Allen, Michael W. Cresswell, Rathindra Ghoshtagore, S Mayo, H Schafft, John A. Kramar
The results from high-quality electrical and physical measurements on the same cross-bridge resistor test structure with approximately vertical sidewalls have shown differences in linewidth as great as 90 nm for selected conductive films. These differences

Measuring Long Gage Blocks with the NIST Line Scale Interferometer

January 1, 1995
Author(s)
John S. Beers
An improved method for temporarily converting long gage blocks into line scales is described. The new process employs fused silica rather than previously used steel conversion gage blocks. Conversion blocks are pairs of small (13 mm) gage blocks with

Performance Evaluations

January 1, 1995
Author(s)
Steven D. Phillips
The subject of coordinate measuring machine (CMM) evaluation is a broad an multifaceted one. The theme of this chapter is the evaluation of CMM measurement uncertainty which is central to the concept of traceability. This chapter elucidates the sources of

Pitch Diameter Measurement of Threaded Gages Using a CMM

January 1, 1995
Author(s)
Ralph C. Veale, Edgar G. Erber, Bruce R. Borchardt
The reference datum for a screw thread is the pitch diameter cylinder. Although a defined method within the United states for pitch diameter measurement exists, it does not follow worldwide procedures, and the complexity and uncertainties associated with

Progress in Tip Modeling

January 1, 1995
Author(s)
John S. Villarrubia
Progress since the last Industrial Applications of Scanned Probe Microscopy workshop in the estimation of tip geometries for scanned probe microscopes is discussed. A new method which does not require calibration of the tip characterizers has been

Scattering by a Dielectric Wedge: Oblique Incidence

January 1, 1995
Author(s)
Egon Marx
The scattering of a plane monochromatic wave by an infinite dielectric wedge is discussed for arbitrary direction of incidence and polarization. Two sets of coupled integral equations for an unknown surface function are derived. The behavior of the fields
Displaying 2076 - 2100 of 2183
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