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NIST Authors in Bold

Displaying 1226 - 1250 of 2189

Machining Process Measurements: A Titanium Machining Example

June 4, 2009
Author(s)
Richard L. Rhorer, Eric P. Whitenton, Timothy J. Burns, Steven P. Mates, Jarred C. Heigel, April L. Cooke, Johannes A. Soons, Robert W. Ivester
NOTE: This is a two-page abstract for publication in the CD-ROM conference proceedings only. Oral presentation of the complete paper will be presented at the conference (SEM, June 1-4, 2009, Albuquerque). This paper discusses recent results of studying Ti

Methods for transferring the SI unit of force from millinewtons to piconewtons

June 1, 2009
Author(s)
Gordon A. Shaw, Koo-Hyun Chung, Douglas T. Smith, Jon R. Pratt
The establishment of standards for small force measurement requires a link to an absolute measurement of force traceable to the international system of units (SI). To this end, a host of different means are being employed by the NIST small force

Standardization Activities for Solid State Lighting in the USA

May 29, 2009
Author(s)
Yoshihiro Ohno
In support of the U.S. Department Energy s Energy Star program for solid state lighting, a series of standards for solid state lighting products have been developed in the USA. The standards published related to measurement and color include ANSI-NEMA

PARAMETER VALIDATION USING CONSTRAINT OPTIMIZATION FOR MODELING AND SIMULATION

May 11, 2009
Author(s)
Guodong Shao, Charles R. McLean, Alexander Brodsky, Paul Ammann
Modeling and simulation (M&S) techniques are increasingly being used to solve problems and aid decision making in many different fields. Results of simulations are expected to provide reliable information for decision makers. But potential errors may be

OntoSTEP: OWL-DL Ontology for STEP

May 4, 2009
Author(s)
Sylvere Krima, Raphael Barbau, Xenia Fiorentini, Sudarsan Rachuri, Ram D. Sriram
The Standard for the Exchange of Product model data (STEP) [1] contains product information mainly related to geometry. The modeling language used to develop this standard, EXPRESS, does not have logical formalism that will enable rigorous semantics. In

Advancing Manufacturing Research Through Competitions

April 17, 2009
Author(s)
Stephen B. Balakirsky, Rajmohan Madhavan
Competitions provide a technique for building interest and collaboration in targeted research areas. This paper will present a new competition that aims to increase collaboration amongst Universities, automation end-users, and automation manufacturers

Use of Semantic Mediation in Manufacturing Supply Chains

April 6, 2009
Author(s)
Peter O. Denno, Edward J. Barkmeyer Jr., Fabian M. Neuhaus
This case discusses lessons learned about enabling interoperability using semantic methods in three automotive industry projects spanning 8 years. In each project, the essential form of the solution is to reconcile differences in viewpoint of entities

Understanding Imaging and Metrology with the Helium Ion Microscope

March 1, 2009
Author(s)
Michael T. Postek, Andras Vladar, Bin Ming
The development of accurate metrology for the characterization of nanomaterials is one barrier to innovation confronting all phases of nanotechnology. Ultra-high resolution microscopy is a key technology needed to achieve this goal. But, current microscope

Manufacturing Interoperability Program, a Synopsis

February 24, 2009
Author(s)
Sharon J. Kemmerer
Started in 2005, the Manufacturing Interoperability Program has seen an investment of roughly 25-30 full-time staff who have researched, developed, and deployed standards, tools, techniques, and testing environments --- helping manufacturing enterprise

ASME B89.4.19 Performance Evaluation Tests and Geometric Misalignments in Laser Trackers

January 30, 2009
Author(s)
Balasubramanian Muralikrishnan, Daniel S. Sawyer, Christopher J. Blackburn, Steven D. Phillips, Bruce R. Borchardt, William T. Estler
Small and unintended offsets, tilts, and eccentricity of the mechanical and optical components in laser trackers introduce systematic errors in the measured spherical coordinates (angles and range readings), and possibly in the calculated lengths of

Dimensional measurement traceability of 3D imaging data

January 19, 2009
Author(s)
Steven D. Phillips, Craig M. Shakarji, Michael Krystek, K Summerhays
This paper discusses the concept of metrological traceability to the SI unit of length, the meter. We describe how metrological traceability is realized, give a recent example of the standardization of laser trackers, and discuss progress and challenges to

Simulation-based Manufacturing Interoperability Standards and Testing

January 7, 2009
Author(s)
Guodong Shao, Swee K. Leong, Charles R. McLean
Software applications for manufacturing systems developed using software from different vendors typically cannot work together. Develop¬ment of custom integrations of manufacturing software incurs costs and delays that hurt industry productivity and

Advice from the CCL on the use of unstabilized lasers as standards of wavelength: the helium-neon laser at 633 nm

January 1, 2009
Author(s)
Jack A. Stone Jr., Jennifer Decker, Patrick Gill, Andrew Lewis, Patrick Juncar, Daniele Rovera, Miguel Villiseid
The Consultative Committee for Length has recommended that red (633 nm) unstabilized Helium-Neon lasers, operating on the 3s2¿_2p4 transition, should be included in the list of standard frequencies for realization of the meter. This article discusses

Scatterfield Optical Imaging for sub-10 nm Dimensional Metrology

January 1, 2009
Author(s)
Richard M. Silver
Recent developments in optical microscopy promise to advance optical metrology and imaging to unprecedented levels through theoretical and experimental development of a new measurement technique called "scatterfield optical imaging". ". Current metrology

NDRProfile Schema Version 1.0 User Guide

December 16, 2008
Author(s)
Joshua Lubell, Betty Harvey, Puja Goyal, Katherine C. Morris
The NDRProfile schema provides a common syntax for exchanging, managing, and reusing XML Schema naming and design rules (NDRs). NDRProfile, used by NIST's Quality of Design (QOD) application as a format for import and export of rule sets, is also useful

2nd Annual Tri-National Workshop on Standards for Nanotechnology - (NIST presentations)

December 10, 2008
Author(s)
Ronald G. Dixson, Jon R. Pratt, Vincent A. Hackley, James E. Potzick, Richard A. Allen, Ndubuisi G. Orji, Michael T. Postek, Herbert S. Bennett, Theodore V. Vorburger, Jeffrey A. Fagan, Robert L. Watters
A new era of cooperation between North American National Measurement Institutes (NMIs) was ushered by the National Research Council of Canada Institute for National Measurement Standards (NRC-INMS) on February 7, 2007 when the first Tri-National workshop

Blind estimation of general tip shape in AFM imaging

December 1, 2008
Author(s)
Fenglei Tian, Xiaoping Qian, John S. Villarrubia
The use of flared tip and bi-directional servo control in some recent atomic force microscopes (AFM) has made it possible for these advanced AFMs to image structures of general shapes with undercuts and reentrant surfaces. Since AFM images are distorted

Development Life Cycle for Semantically Coherent Data Exchange Specification

December 1, 2008
Author(s)
Boonserm Kulvatunyou, Katherine C. Morris, Simon P. Frechette
In enterprise integration, a data-exchange specification is an architectural artifact that evolves along with the business. Maintaining a coherent, data-exchange, semantic model is an important, yet non-trivial task. A coherent, semantic model of data-
Displaying 1226 - 1250 of 2189
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