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Displaying 976 - 1000 of 4225

Assessment of a 3D-Printed Aluminum Corrugated Feed Horn at 118.7503 GHz

February 19, 2017
Author(s)
Josh Gordon, David R. Novotny, Ronald C. Wittmann, Michael H. Francis, Jeffrey R. Guerrieri, Periasamy Lavanya, Albin Gasiewski
All-metal 3D printing is investigated as a viable option for millimeter wave applications. 3D printing is finding applications across many areas and may be a useful technology for antenna fabrication. The ability to rapidly fabricate custom antenna

Establishing a World-Wide Unified Rockwell Hardness Scale Using Standard Diamond Indenters

February 19, 2017
Author(s)
S Desogus, A Germak, H Ishida, T Polzin, H Yang, Jun-Feng Song, Samuel Low, David J. Pitchure
Recently developed microform measurement techniques have reduced the measurement uncertainties in the geometry of Rockwell diamond indenters. It is now possible to establish standard grade Rockwell diamond indenters characterized by high geometry

Imaging Optics and CCD Camera Characterization for Metrology

February 19, 2017
Author(s)
S Fox, Edward A. Kornegay, Richard M. Silver
Optical semiconductor characterization and metrology rely heavily on digital camera imaging and its associated optical imaging systems. This work characterizes the performance of a widely used, commercially available camera and compares its performance to

Adaptive Multi-scale Prognostics and Health Management for Smart Manufacturing Systems

February 10, 2017
Author(s)
Benjamin Y. Choo, Brian Weiss, Jeremy Marvel, Stephen C. Adams, Peter A. Beling
Adaptive Multi-scale Prognostics and Health Management (AM-PHM) is a methodology designed to enable PHM in smart manufacturing systems. As a rule, PHM information is not yet fully utilized in higher-level decision-making in manufacturing systems. AM-PHM

Enabling photoemission electron microscopy in liquids via graphene-capped microchannel arrays

February 8, 2017
Author(s)
Hongxuan Guo, Evgheni Strelcov, Alexander Yulaev, Jian Wang, Narayana Appathurai, Stephen Urquhart, John Vinson, Subin Sahu, Michael P. Zwolak, Andrei Kolmakov
Photoelectron emission microscopy (PEEM) is a powerful tool to spectroscopically access dynamic surface processes at the nanoscale but is traditionally limited to ultra-high or moderate vacuum conditions. Here, we develop a novel graphene-capped

Industrial Wireless Systems: Radio Propagation Measurements

January 30, 2017
Author(s)
Richard Candell, Catherine A. Remley, Jeanne T. Quimby, David R. Novotny, Alexandra Curtin, Peter B. Papazian, Galen H. Koepke, Joseph Diener, Mohamed T. Hany
Radio frequency (RF) propagation measurements were conducted at three facilities representing a cross-section of different classes of industrial environments. Selected sites included a multi-acre transmission assembly factory typical of the automotive

Homogenization Kinetics of a Nickel-based Superalloy Produced by Powder Bed Fusion Laser Sintering

January 26, 2017
Author(s)
Fan Zhang, Lyle E. Levine, Andrew J. Allen, Eric Lass, Sudha Cheruvathur, Mark R. Stoudt, Maureen E. Williams, Yaakov S. Idell, Carelyn E. Campbell
Additively manufactured (AM) metal components often exhibit fine dendritic microstructures and elemental segregation due to the initial rapid solidification and subsequent melting and cooling during the build process, which without homogenization would

Laser-assisted atom probe tomography of Ti/TiN films deposited on Si

December 21, 2016
Author(s)
Norman A. Sanford, Paul T. Blanchard, Ryan M. White, Michael R. Vissers, Albert Davydov, D R. Diercks, David P. Pappas
Laser-assisted atom probe tomography (L-APT) was used to examine superconducting TiN/Ti/TiN trilayer films with nominal respective thicknesses of 5/5/5 (nm). The trilayers were deposited on Si substrates by reactive sputtering. Electron energy loss
Displaying 976 - 1000 of 4225
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