Fox, S.
, Kornegay, E.
and Silver, R.
(2017),
Imaging Optics and CCD Camera Characterization for Metrology, Proceedings of American Institute of Physics, , USA
(Accessed May 22, 2025)
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Imaging Optics and CCD Camera Characterization for Metrology
Published
Author(s)
, ,
Abstract
Optical semiconductor characterization and metrology rely heavily on digital camera imaging and its associated optical imaging systems. This work characterizes the performance of a widely used, commercially available camera and compares its performance to that of the art digital camera. It is shown that well corrected lens systems may still exhibit high spatial frequency variations leading to errors of several nanometers for a 1 micrometer pitch measurement. Methods for mapping and correction of such errors are also presented.Proceedings Title
Proceedings of American Institute of Physics
Conference Location
, USA
Pub Type
Conferences
Keywords
CCD camera, metrology, overlay, self-calibration
Citation
Issues
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Created February 19, 2017