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Displaying 68376 - 68400 of 74507

Surface Analysis by Electron Spectroscopy at High Pressures

March 1, 1978
Author(s)
Cedric Powell
Surface analyses are now made by techniques such as Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), and appearance potential spectroscopy (APS). These techniques utilize low-energy electrons and have high surface sensitivity but

Auger Electron Spectroscopy

February 1, 1978
Author(s)
Cedric J. Powell
A convenient measure of surface sensitivity in Auger-electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS) is the mean escape depth (MED). If the effects of elastic-electron scattering are neglected, the MED is equal to the electron

High Resolution Photoemission Study of Condensed Layers of Nitrogen and Carbon Monoxide

February 1, 1978
Author(s)
P R. Norton, R L. Tapping, H P. Broida, John William Gadzuk, B Waclawski
Values are reported for the absolute yields of KVV Auger electrons from beryllium and L 23VV Auger electrons from aluminum excited by 60- to 220-keV proton bombardment. The measurements were made using semi-infinite evaporated samples, and the results were

A new look at windows:

January 1, 1978
Author(s)
Belinda L Collins, Rosalie T Ruegg, Robert Chapman, Tamami Kusuda
Displaying 68376 - 68400 of 74507
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