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Displaying 59476 - 59500 of 74196

A Guide to the Selection of Anti-Virus Tools and Techniques

December 1, 1992
Author(s)
William T. Polk, Lawrence E. Bassham
Computer viruses continue to pose a threat to the integrity and availability of computer systems. This is especially true for users of personal computers. A variety of anti-virus tools are now available to help manage this threat. These tools use a wide

A User's Guide for CFAST Version 1.6

December 1, 1992
Author(s)
Paul A. Reneke, Walter W. Jones, Richard D. Peacock, Rebecca W. Portier
CFAST is a zone model capable of predicting the environment in a multi-compartmentstructure subjected to a fire. This guide provides a detailed description of the pre- and post-processing routines used by the model, the data input requirements, and the

Acoustic Emission of Structural Materials Exposed to Open Flames

December 1, 1992
Author(s)
William L. Grosshandler, M A. Jackson
The use of acoustic emission (AE) as an early indicator of structural materials exposed to a flame has been investigated and found to be possible. Piezoelectric transducers have been mounted directly on 0.5 m long, simply supported beams of aluminum

Acoustic Emission of Structural Materials Exposed to Open Flames

December 1, 1992
Author(s)
William L. Grosshandler, M A. Jackson
The use of acoustic emission (AE) as an early indicator of structural materials exposed to a flame has been investigated and found to be possible. Piezoelectric transducers have been mounted directly on 0.5 m long, simply supported beams of aluminum

Automated Tools for Testing Computer System Vulnerability

December 1, 1992
Author(s)
William T. Polk
Computer security "incidents" occur with alarming frequency. The incidents range from direct attacks by both hackers and insiders to automated attacks such as network worms. Weak system controls are frequently cited as the cause, but many of these

Calibrating On-Wafer Probes to the Probe Tips

December 1, 1992
Author(s)
Dylan F. Williams, Roger Marks
This paper investigates the accuracy of on-wafer scattering-parameter calibrations at the probe tips. Data show the extent to which certain probe-tip calibrations are consistent with one another and applicable to the characterization of devices or circuits
Displaying 59476 - 59500 of 74196
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