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Displaying 57451 - 57475 of 74214

Wave packet dynamics in the Li 2 E( 1 S g + ) shelf state: Simultaneous observation of vibrational and rotational recurrences with single ro-vibronic control of an intermediate state

January 1, 1995

Author(s)

J M. Papanikolas, R M. Williams, P D. Kleiber, J L. Hart, C Brink, S D. Price, S R. Leone

Working and Check Standards for NIST Surface and Microform Measurements

January 1, 1995

Author(s)

Jun-Feng Song, Theodore V. Vorburger

Different working standards and check standards are used in the NIST surface and microform measurement laboratory for calibrating instruments, establishing measurement traceability and control measurement uncertainty. The basic requirements for these

Workshop Report 1: Scanning Electron Microscope Metrology as Related to a Defined Edge Structure

January 1, 1995

Author(s)

Michael T. Postek, Andras Vladar, G Banke, T Reilly

An accurate electron beam model is primary to the understanding of the SEM image. Several independently developed Monte Carlo models have been introduced for this purpose and a modeling round-robin has just been conducted to compare the results of these

X-ray emission from the Sun in its youth and old age

January 1, 1995

Author(s)

J D. Dorren, M G{umlat}del, E F. Guinan

X-Ray Generation and Image Capture: Monoenergetic X-Ray Sources

January 1, 1995

Author(s)

R Deslattes, C -. Tang

X-Rays from Radiative Electron Capture of Free Cooling Electrons for Precise Lamb-Shift Measurements at High Z: Au 78+

January 1, 1995

Author(s)

H F. Beyer, D Liesen, F Bosch, K D. Finlayson, M Jung, O Klepper, R Moshammer, K Beckert, H Eickoff, B Franzke, F Nolden, P Spadtke, M Steck, G Menzel, R Deslattes

Z39.50 implementation experiences:

January 1, 1995

Author(s)

Paul Over, William E Moen, Ray Denenberg, Lennie Stovel

A Monte Carlo Model for SEM Linewidth Metrology

December 31, 1994

Author(s)

J R. Lowney, Michael T. Postek, Andras Vladar

A New Method to Measure the Distance Between Graduation Lines on Graduated Scales

December 31, 1994

Author(s)

William B. Penzes, Richard A. Allen, Michael W. Cresswell, E C. Teague

An Exact Solution of the Steady-State Surface Temperature for a General Multilayer Structure

December 31, 1994

Author(s)

John Albers

Application of the Modified Voltage-Dividing Potentiometer to Overlay Metrology in a CMOS/Bulk Process

December 31, 1994

Author(s)

Richard A. Allen, Michael W. Cresswell, Loren W. Linholm, Jinsheng Wen, Colleen E. Hood, T. A. Hill, J. D. Benecke, S. R. Volk, H. D. Stewart