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Displaying 54851 - 54875 of 73697

Selection of Calibration Particles for Scanning Surface Inspection Systems

August 8, 1996
Author(s)
George W. Mulholland, Nelson P. Bryner, Walter S. Liggett Jr, B W. Scheer, R. K. Goodall
In response to the semiconductor industry's need for both smaller calibration particles and more accurately sized larger particles, a joint SEMATECH, National Institute of Standards and Technology, and VLSI Standards, Inc. project was initiated to

Application of Chaotic Dynamics to Stochastic Resonance.

August 7, 1996
Author(s)
Marek Franaszek, Emil Simiu
For a class of systems with a periodic signal and noise, the improvement of the signal to noise ratio (SNR) achieved by increasing the noise intensity is referred to as stochastic resonance (SR). We show that, for a class of multistable systems, a chotic

A Neural Network Based Scheduling System for Flexible Manufacturing Cells

August 1, 1996
Author(s)
Albert T. Jones, Ying Sun, Yuehwern Yih, Luis C. Rabelo
To meet dynamic market demands and manage uncertainty during production, a flexible scheduling system is essential. In this paper we present a neural network-based scheduling system that is able to adapt different scheduling strategies dynamically, based

An Object-oriented Representation of Product and Design

August 1, 1996
Author(s)
Gerard Kim, S Gorti, A Gupta, A Wong, Ram D. Sriram
We introduct a representation scheme for engineering design synthesis that includes not only a way to represent an evolving attifact but also the design process. The representation uses an object-oriented approach in order to model a wide range of design

Application Protocol 227 Validation Report Version 1.0.

August 1, 1996
Author(s)
S W. Kline, Mark E. Palmer
Part 227 of ISO 10303, "Plant Spatial Configuration," specifies an application protocol (AP) for the exchange of spatial configuration information of process plants. This includes shape characteristics, spatial arrangement characteristics, and design and

Beyond Product Design Data: Data Standards for Manufacturing Resources

August 1, 1996
Author(s)
Kevin K. Jurrens, Mary B. Algeo, James E. Fowler
The benefits of industrial standards are well-known. They facilitate common markets, influence marketing patterns, and augment the operations of distributed enterprises. Standards for representing, using and exchanging manufacturing data, like standards

Effect of Load Path on Damage to Concrete Bridge Piers

August 1, 1996
Author(s)
A W. Taylor, A El-Bahy, William C. Stone, S K. Kunnath
In earthquake engineering studies of reinforced concrete (RC) bridge columns, a controlled, cyclic lateral load pattern with gradually increasing amplitude has traditionally been applied to laboratory test specimens. However, in actual earthquakes bridge

Enhancement of EXIT89 and Analysis of World Trade Center Data

August 1, 1996
Author(s)
R F. Fahy
The features of an enhanced model for egress from fires in non-residential occupancies is presented along with a users manual describing the use of the model. The enhancements to the model include analysis of locations of safety, smoke blockages, disabled

HVAC CAD Layout Tools: A Case Study of University/Industry Collaboration

August 1, 1996
Author(s)
J Cagan, R Clark, P Dastidar, Simon Szykman, P Weisser
An effective partnership between industry and the university resulted in the system of design tools for the layout of HVAC systems presented in this paper and illustrated with the design of a heat pump. The system provides tools to assist in the placement

Hyperthermal (1-10 eV) cobalt deposition on Si(100)

August 1, 1996
Author(s)
M P. Knowles, S R. Leone
Cobalt atoms with enhanced kinetic energy (0-10 eV) are deposited on room temperature Si(100) and compared to thermal cobalt deposition. Growth is monitored with Auger electron spectroscopy (AES) and low energy electron diffraction (LEED). At low coverages

Improved measurements of the hyperfine structure of 87 Rb5P 3/2 state

August 1, 1996
Author(s)
J Ye, S Swartz, P Jungner, John L. Hall
We have constructed two highly stable and reproducible Rb D 2 saturated absoption spectrometers at 780 nm, using rf frequency sideband technique and third harmonic dither lockin detection method respectively. We have achieved +or-}3 kHz reproducibility on
Displaying 54851 - 54875 of 73697
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