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Displaying 54051 - 54075 of 74189

Microwave Dielectric Characterization of Bulk Ferroelectrics

September 1, 1997
Author(s)
Claude Weil, Richard G. Geyer, L. Sengupta
We discuss the application of existing RF measurement techniques, including waveguide and mode-filtered cavity resonator methods, to the dielectric characterization of bulk high permitivity ferroelectrics at microwave frequencies.

Modulation of the Charge of a Single-Electron Transistor by Distant Defects

September 1, 1997
Author(s)
Neil M. Zimmerman, J. L. Cobb, Alan F. Clark
We have systematically measured two-level fluctuator [TLF] noise in a single-electron tunneling transistor. From the amplitude, duty cycle, and presence of intermediate states, we conclude that there is a cluster of triggered TLF's in this case. The

Optimizing the NIST Magnetic Imaging Reference Sample

September 1, 1997
Author(s)
Paul Rice, Stephen E. Russek, J Hoinville, Michael H. Kelley
We have further developed the NIST magnetic imaging reference sample to include a magnetic pattern which can indicate the magnetic polarity of a magnetic force microscope tip. Several samples cut from the same disk were measured with a single tip. We have

Overview for Special Issue of Standard View

September 1, 1997
Author(s)
S A. Wakid, Shirley M. Radack
This article introduces a Special Issue of StandardView, in which some of the critical measurement issues that challenge the information technology community are explored. A series of papers are presented in the Special Issue to look at some of the first

Requirements for Modeling Manufacturing Process: A New Perspective

September 1, 1997
Author(s)
Craig I. Schlenoff, Amy Knutilla, Steven R. Ray
A wide range of applications deal with the manipulation and expression of collections of activities. Each of these applications serves a specific audience and need, and focuses on particular aspects of a process. Nevertheless, much could be gained by

Rotating-polarizer polarimeter for accurate retardance measurement

September 1, 1997
Author(s)
Paul A. Williams, Allen Rose, Chih-Ming Wang
We demonstrate an automated polarimeter based on a rotating polarizer for the measurement oflinear retardance independent oflaser power and detector gain. The retardance is found when a curve is fitted to a unique normalization of the intensity response of

Scattering From Sinusoidal Gratings

September 1, 1997
Author(s)
B C. Park, Theodore V. Vorburger, Thomas Germer, Egon Marx
Laser light scattering from holographic sinusoidal gratings has been investigated with a view to its use in the calibration of the linearity of BRDF instruments, a task that requires a wide dynamic range in the scattered intensity. An aluminum-coated

Self-Assembled Monolayers Exposed by Metastable Argon and Metastable Helium for Neutral Atom Lithography and Atomic Beam Imaging

September 1, 1997
Author(s)
A Bard, K K. Berggren, J L. Wilbur, John D. Gillaspy, S L. Rolston, Jabez J. McClelland, William D. Phillips, M Prentiss, G M. Whitesides
We used a beam of noble gas atoms in a metastable excited state to expose a thin (1.5nm self-assembled monolayer resist applied over a gold-coated silicon wafer. We determined exposure damage as a function of dose of metastable atoms by processing the

The Application Protocol Information Base World Wide Web Gateway

September 1, 1997
Author(s)
Joshua Lubell
The Application Protocol Information Base (APIB) is an on-line repository of documents for the Standard for the Exchange of Product model data (STEP, officially ISO 10303 - Product Data Representation and Exchange). Document types in the APIB include STEP

The creation and study of Bose-Einstein condensation in a cold alkali vapor

September 1, 1997
Author(s)
C E. Wieman, Eric A. Cornell, Deborah S. Jin, J R. Ensher
Bose-Einstein condensation in a gas resulted form the combination of research in laser cooling and trapping, the study of spin polarized hydrogen, and the investigation of atomic collisions at very low temperatures. After discussing how these advances led
Displaying 54051 - 54075 of 74189
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