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Displaying 49776 - 49800 of 73832

Summaries of the Programs of the Manufacturing Engineering Laboratory 1999

August 2, 1999
Author(s)
Lisa J. Fronczek, Bessmarie A. Young
The National Institute of Standards and Technology's Manufacturing Engineering Laboratory (MEL) works with the U.S. manufacturing industry to develop and apply infrastructural technology, measurements, and standards to meet their needs. This report

Ultrasound Power Measurement by Pulsed Radiation Pressure

August 2, 1999
Author(s)
Steven E. Fick
In a specially designed radiation force balance (RFB), low-frequency pulse modulation of the incident ultrasound allows high-accuracy measurement of time-averaged spatially-integrated ultrasound power radiated into a reflectionless water load. Errors

A Band-Structure-Based Approach to Modeling X-Ray Absorption, Fluorescence, and Resonant Inelastic Scattering

August 1, 1999
Author(s)
Eric L. Shirley, J A. Carlisle, Steven R. Blankenship, R N. Smith, L J. Terminello, J J. Jia, T A. Callcott, D L. Ederer
X-ray optical processes in solids--absorption, fluorescence and resonantscattering--are modeled within a band-structure-basedapproach to describe electron states. The theory goes beyond a simpleone-electron treatment by considering self-energy corrections

A Causal Microwave Circuit Theory and Its Implications

August 1, 1999
Author(s)
Dylan Williams, Bradley Alpert
We will describe a new causal power-normalized waveguide equivalent-circuit theory and explore its implications. The new theory marries a power normalization with additional constraints that enforce simultancity of the theory's voltages and currents and

A Comparison of 1 T O} and 10 T O} High-Resistance Standards Between NIST and Sandia

August 1, 1999
Author(s)
Dean G. Jarrett, Ronald F. Dziuba, Marlin E. Kraft
NIST-built 10 T ω and commercial 1 T ω standard resistors were hand carried between NIST and Sandia for a high resistance comparison. The comparison tested the ruggedness of the new NIST-built standard resistors, provided a check of the scaling between the

Apparent Correlation of Fracture Toughness and Strength

August 1, 1999
Author(s)
R G. Munro, Stephen W. Freiman
An extensive collection of fracture toughness (KIc) and strength ( f) data for brittle materials has been used to examine the relation between the mean measured values of KIc and f. The two properties have been found to have a weak, but useful, empirical

Atom Loss From Bose-Einstein Condensates Due to Feshbach Resonance

August 1, 1999
Author(s)
V Yurovsky, A Ben-Reuven, Paul S. Julienne, Carl J. Williams
In recent experiments on Na Bose-Einstein condensates [S. Inouye et al., Nature 392, 151 (1998); J. Stenger et al., Phys. Rev. Lett. 82, 2422 (1999)], large loss rates were observed when a time-varying magnetic field was used to tune a molecular Feshbach

Atomic Spectra Databases on the World Wide Web -- An Update

August 1, 1999
Author(s)
Wolfgang L. Wiese, Daniel E. Kelleher
This article represents an update ato a previous review of databases published here in 1997 [1]. Since that time a number of significant changes have evolved, including a much-expanded new edition of the NIST 'Atomic Spectra Database'. The basic electronic

Benchmark Data for Fuel Atomization and Combustion Models

August 1, 1999
Author(s)
J F. Widmann, S R. Charagundla, Cary Presser
Experimental data were collected for the purpose of validating multiphase combustion models and submodels. A spray combustor was fabricated that permits well-defined boundary and input conditions, and measurements were carried out that characterize the

Chemistry and Structure of Hydration Products

August 1, 1999
Author(s)
Paul E. Stutzman
This chapter covers papers published and abstracted in 1996 relating to cement hydration and the chemistry and structure of hydration products.

Closing Remarks for X99

August 1, 1999
Author(s)
R Deslattes
The following brief essay attempts to summarize some of my remarks at the closing session of X- 99. The three sections below include a well-deserved appreciation for the effective work of the organizers and the conference staff. A second somewhat longer

Conceptual Process Planning - A Definition and Functional Decomposition

August 1, 1999
Author(s)
Shaw C. Feng, Gordon A. Shaw, Yuyun Zhang
Conceptual process planning is an activity for designers to evaluate manufacturability and the manufacturing cost in the early design stage for mechanical parts production. Since major manufacturing costs of a product are committed in product specification
Displaying 49776 - 49800 of 73832
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