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Displaying 48826 - 48850 of 73830

NIST Random Profile Roughness Specimens and Standard Bullets

January 1, 2000
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Robert A. Clary, Michael L. McGlauflin, Eric P. Whitenton, Christopher J. Evans
Based on the numerical controlled (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two prototype standard bullets were developed at the National Institute of Standards and Technology (NIST). These standard

NIST Random Profile Roughness Specimens and Standard Bullets

January 1, 2000
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Christopher J. Evans, Michael L. McGlauflin, Eric P. Whitenton, Robert A. Clary
Based on the numerical controlled (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two prototype standard bullets were developed at the National Institute of Standards and Technology (NIST). These standard

NIST Smart Space: Pervasive Computing Initiative

January 1, 2000
Author(s)
Lynne S. Rosenthal, Vincent M. Stanford
The next great computing paradigm shift, to pervasive computing, is already well under way and will have no less of an impact on industry, government, and daily life than the personal computing revolution. Pervasive computing refers to the emerging trend

NIST Unveils Status of PIM Testing

January 1, 2000
Author(s)
Jeffrey Jargon, Donald C. DeGroot
In response to requests by U.S. industry and members of the International Electrotechnical Commision, the National Institute of Standards and Technology initiated a passive intermodualtion measurement comparison for the U.S. wireless industry. The goal of
Displaying 48826 - 48850 of 73830
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