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Search Publications

NIST Authors in Bold

Displaying 48326 - 48350 of 73697

Assignment of Enzyme Substrate Specificity by Principal Component Analysis of Aligned Protein Sequences: An Experimental Test Using DNA Glycosylase Homologues

January 1, 2000
Author(s)
A Gogos, D Jantz, K. J. Tuerk, D Richardson, M. Dizdaroglu, N D. Clarke
We have studied the relationship between amino acid sequence and substrate specificity in a DNA glycosylase family by characterizing experimentally the specificity of four new members of the family. We show that principal component analysis (PCA) of the

Automatic Language Model Adapation for Spoken Document Retrieval

January 1, 2000
Author(s)
C G. Auzanne, John S. Garofolo, Jonathan G. Fiscus, W M. Fisher
This paper describes experiments implemented at NIST in adapting language models over time to improve recognition of broadcast news recorded over many months. These experiments were designed specifically to improve the utility of automatically generated

Blends of Fatty-Acid-Modified Dendrimers With Polyolefins

January 1, 2000
Author(s)
Barry J. Bauer, A Ramzi, D W. Liu, R L. Scherrenberg, P Froehling, J Joosten
Blends were made by solution and melt mixing fatty acid modified dendrimers with various polyolefins. Small angle neutron scattering (SANS) was used to determine the miscibility of the blends. Poly propylene imine (PPI) dendrimers G1, G3, and G5 (DAB-dendr

C30 Self-Assemblied Monolayers on Silica, Titania, and Zirconia: HPLC Performance, Atomic Force Microscopy, Ellipsometry, and NMR Studies of Molecular Dynamcis and Uniformity of Coverage.

January 1, 2000
Author(s)
David L. VanderHart, Lane C. Sander, Xiaohong Gu, Tinh Nguyen, Stephen A. Wise, M Pursch, D A. Gajewski
C30 self-assembled monolayers (SAMs) have been prepared on zirconia, titania and two different silica gels by reacting C30 trichlorosilane with the humidified surfaces. 13 deg C solid-state NMR spectroscopy indicated higher alkyl chain order on titania and

Calculation of Spin-Dependent Interface Resistance

January 1, 2000
Author(s)
Mark D. Stiles, David R. Penn
A simple expression for the interface resistance between two materials has been derived by Schep et al. [J. Magn. Magn. Mater. 177, 1166 (1998).] in terms of the transmission probability for electrons at the interface. This approximation is tested for a
Displaying 48326 - 48350 of 73697
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