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Search Publications

NIST Authors in Bold

Displaying 48051 - 48075 of 73697

Influence of Polymer Melt Behavior on Flammability (NISTIR 6588)

March 1, 2000
Author(s)
Thomas J. Ohlemiller, Kathryn M. Butler
As the initial step in a study of the role of polymer melt viscosity in polymer burning behavior, a simpler, non-burning configuration has been examined. Vertical slabs of two types of polypropylene have been subjected to uniform radiative heating on one

Information-Based Manufacturing Program Summary and Accomplishments

March 1, 2000
Author(s)
David C. Stieren, Mark E. Luce
This report summarizes the Information-Based Manufacturing Program of the National Institute of Standards and Technology (NIST) by providing an overview of the program and highlighting key accomplishments that have been achieved. The Information-Based

MALDI-TOF Mass Spectrometry of Polymeric Silsesquioxanes

March 1, 2000
Author(s)
William E. Wallace, Charles M. Guttman, Joseph M. Antonucci
Matrix-assisted laser desorption ionization time-of-flight mass spectrometry has been shown to be an effective method to determine the degree-of-intramolecular-condensation of polymeric silsesquioxanes. The nature of the organic R' leaving group was found

Molecular Dynamics Study of Tethered Chains

March 1, 2000
Author(s)
Raymond D. Mountain, Joseph B. Hubbard, Curtis W. Meuse, V Simmons
The results of a series of molecular dynamics simulations of monolayer films formed by tethered, long chain molecules (octadecanthiol) are discussed. The emphasis is on the structure of the chains. The density profiles, the distribution of gauche defects

Morphological Stability of Ni(Al)/Ni 3 Al Nanolaminate Composites

March 1, 2000
Author(s)
J P. Fain, R Banerjee, Daniel Josell, P M. Anderson, H Fraser, N Tymiak, W Gerberich
This manuscript discusses the morphological instability observed when multilayered samples with alternating layers of γ-Ni(Al)/γ 1-Ni 3Al are exposed to 800 degrees}C for approximately 100 h. Samples with 20 nm / 20 nm or 120nm/120nm layer thickness and ir

National Voluntary Laboratory Accreditation Program (NVLAP) 2000 Directory

March 1, 2000
Author(s)
Vanda R. White
The NVLAP Directory is published annually and provides a listing of laboratories accredited by the National Voluntary Laboratory Accreditation Program (NVLAP), National Institute of Standards and Technology. Approximately 700 laboratories in 24 fields of

NIST Serial Holdings 2000

March 1, 2000
Author(s)
Susan A. Sanders, S S. Edwards
This publication contains bibliographic information on approximately 5,000 titles held in the NIST Research Library, representing current and noncurrent journals, periodicals, annuals, memoirs, proceedings, and transactions.

Noise-Optimized Silicon Radiometers

March 1, 2000
Author(s)
George P. Eppeldauer
Transimpedance-gain, loop-gain, and voltage-gain requirements of photodide short-circuit-current meters are summarized for ac and dc optical radiation measurements. Design considerations to implement the gain equations in silicon radiometers are discussed

Ontology Engineering for Distributed Collaboration in Manufacturing

March 1, 2000
Author(s)
L Pouchard, Nenad Ivezic, Craig I. Schlenoff
The problems of inter-operability are acute for manufacturing applications, as applications using process specifications do not necessarily share syntax and definitions of concepts. The Process Specification Language developed at the National Institute of

Perceptual Effects of Noise in Digital Video Compression

March 1, 2000
Author(s)
Charles D. Fenimore, John M. Libert, S. A. Wolf
This paper presents the results of subjective viewer assessment of the quality of MPEG-2 compressed video containing wideband Gaussian noise. The video test sequences consisted of seven test clips (both classical and new materials) to which noise with a

Physics Laboratory Technical Activities 1999

March 1, 2000
Author(s)
K B. Gebbie
This report summarizes research projects, measurement method development, calibration and testing, and data evaluation activities that were carried out during calendar year 1999 in the NIST Physics Laboratory. These activities are in the areas of electron

Polarimetric BRDF in the Microfacet Model: Theory and Measurements

March 1, 2000
Author(s)
R G. Priest, Thomas Germer
A key to modeling polarimetric signatures of painted objects is the polarimetric bidirectional reflectance distribution function (BRDF). In particular, it is important to correctly capture the out-of-plane behavior of the BRDF. From the theoretical point

Preparation and Characterization of Polymer/Dendrimer Blends: Final Report, March 2000

March 1, 2000
Author(s)
Eric J. Amis, Barry J. Bauer, A Topp, F Groehn, T J. Prosa, B D. Viers, Da-Wei Liu, K A. Barnes, C L. Jackson, G Nisato, Alamgir Karim, Jack F. Douglas
This report is a summary of the results of measurement and characterization on dendritically branched polymers that was done under Army Research Office Grant contract 35109-CH. This summary encompasses 3 previous NISTIR's for consecutive 12 month periods

Preparative Electrochromatography of Proteins in Various Types of Porous Media

March 1, 2000
Author(s)
C M. Tellez, Kenneth D. Cole
The performance of commercial and enzymatically-modified size-exclusion (SE) gels in electrochromatography was compared for preparative protein separations. Dextran and agarose-based SE gels were subjected to enzymatic digestion under mild conditions. This
Displaying 48051 - 48075 of 73697
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