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Displaying 47701 - 47725 of 73830

Silicon Nitride Boundary Lubrication: Effect of Sulfonate, Phenate, and Salicylate Compounds

July 1, 2000

Author(s)

Richard S. Gates, Stephen M. Hsu

The boundary lubrication characteristics of sulfonates, phenates, and salicylates in a silicon nitride on silicon nitride contact were investigated. The additives were blended at one percent by weight solution in a purified paraffinic base oil and tested

SIMnet: An Internet-Based Video Conferencing System Supporting Metrology

July 1, 2000

Author(s)

William E. Anderson, Nile M. Oldham, Mark E. Parker

SIMnet is a computer network implemented in 1999 to facilitate international comparisons, and foster collaborations between national metrology laboratories in the Americas. The system employs standard hardware and a special network server to allow audio

Simultaneous Measurement of Torque, Axial Normal Force and Volume Change in the NIST Torsional Dilatometer

July 1, 2000

Author(s)

Carl R. Schultesiz, G B. McKenna

The NIST Torsional Dilatometer measures simultaneously the torque, axial normal force and volume change in response to a torsional deformation. While the torque is a linear function of the angle of twist per unit of length, the normal force and volume

Single-Color Photoassociative Ionization of Ultracold Sodium: The Region from 0 to -5 GHz

July 1, 2000

Author(s)

A Amelink, Kevin Jones, Paul D. Lett, P Van der Straten, H G. Heideman

We have measured the rate of production of Na 2 + in collisions of ultracold Na atoms held in a magneto-optical trap (MOT) as a function of probe laser detuning using a single-color probe beam. The ion rate is measured with the atoms mainly in the 3S(f=2)

Specification of Interactions in Integrated Manufacturing Systems

July 1, 2000

Author(s)

David W. Flater

Systems of manufacturing software are often constructed by integrating pre-existing software components. Accurate specification of the component interactions in these systems is needed to ensure testability and maintainability. Moreover, standards for

Specification of Interactions in Integrated Manufacturing Systems

July 1, 2000

Author(s)

David W. Flater

Splicing Together Size Distributions to Increase the Size Range of a Phase Doppler Interferometer

July 1, 2000

Author(s)

J F. Widmann, S R. Charagundla, Cary Presser, Stefan D. Leigh

A phase Doppler interferometer (PDI) was used to measure the intensity (i.e., the expected number of droplets measured per unit time) of a swirling methanol spray flame. Gaps observed in the data, which have been previously reported (McDonell and Samuelsen

Standard Test Data for Estimating Peak Parameter Errors in X-Ray Photoelectron Spectroscopy: II. Peak Intensities

July 1, 2000

Author(s)

Joseph M. Conny, Cedric J. Powell

Standard test data for x-ray photoelectron spectroscopy (XPS-STD) have been developed for determining bias and random error in peak parameters derived from curve fitting in XPS. The XPS-STD are simulated C 1s spectra from spline polynomial models of

Status of Microanalysis Standards at the National Institute of Standards and Technology (NIST)

July 1, 2000

Author(s)

Ryna B. Marinenko

This is a review of the current status of microanalysis standards at NIST -what is presently available, what will soon be available, and what might be available in the future. Many of the standards issued in the past such as Cartridge Brass (SRM 478), Fe-3

Structural Information Mapping with Express-X

July 1, 2000

Author(s)

D B. Sanderson, Peter O. Denno

This paper provides an overview of the Express-X language, a language that provides structural information mapping of information modeled in EXPRESS schema. The paper presents the design rationale for Express-X. The paper also serves as a tutorial in

Technology Roadmaps for Compound Semiconductors

July 1, 2000

Author(s)

Herbert S. Bennett

Technology Services FY1999 Technical Activities Report

July 1, 2000

Author(s)

C P. Sturrock

This report summarizes the FY1999 technical activities of TechnologyServices, National Institute of Standards and Technology. These activitiesare in the areas of standards services, including coordination of nationaland international standards-related

Temperature Effects on Fatigue of Polymer Composites

July 1, 2000

Author(s)

Hai C. Tang, Tinh Nguyen, Tze J. Chuang, Joannie W. Chin, Hanchang F. Wu, J Lesko

Fiber-reinforced polymeric composites provide lightweight, high strength, and corrosive resistance to severe environmental exposures. These composites have been extensively used in aerospace and military application over the last three decades and are

Temperature Effects on the High Speed Response of Digitizing Sampling Oscilloscopes

July 1, 2000

Author(s)

Donald R. Larson, Nicholas Paulter

We describe the effects of temperature on the performance of 20 GHz and 50 GHz digital sampling oscilloscopes and high speed pulse generators. The temperature of the sampling heads is varied through the manufacturer's specified minimum operating

Testing for Feasible Performance of a Distributed Manufacturing System: a Brief Experience Report

July 1, 2000

Author(s)

David W. Flater

NIST researchers conducted a series of informal performance tests to establish confidence that an existing manufacturing process control system could successfully be replaced by a Common Object Request Broker Architecture (CORBA)-based system. Relative to

Testing for Imperfect Integration of Legacy Software Components

July 1, 2000

Author(s)

David W. Flater

In the manufacturing domain, few new distributed systems are built ground-up; most contain wrapped legacy components. While the legacy components themselves are already well-tested, imperfect integration can introduce subtle faults that are outside the

The Effect of Parent Zero-Point Motion on the ND 2 ( ) Rotational State Distribution in the 193.3 nm Photolysis of ND 3

July 1, 2000

Author(s)

J P. Reid, R A. Loomis, S R. Leone

The vibrational and rotational product-state distributions of ND 2( 2A 1) has been probed following the photodissociation of ND 3 at 193.3 nm by time-resolved Fourier Transofrm infrared emission spectroscopy. The dynamics of the bond cleavage are inferred

The Role of Standards in Innovation

July 1, 2000

Author(s)

Robert Allen, Ram D. Sriram

We review and explore the role of standards in innovation, with particular emphasis on the design and manufacturing processes. We begin by defining and classifying standards and by exploring their role and infrastructure in society. This is followed by a

The Vibrational Spectra of Molecular Ions Isolated in Solid Neon. XVI. SO + 2 , SO - 2 , and (SO 2 ) - 2

July 1, 2000

Author(s)

D Forney, C B. Kellogg, Warren E. Thompson, Marilyn E. Jacox

When a Ne:SO 2 mixture is subjected to Penning ionization and/or photoionization by neon atoms in their first excited states, between 16.6 eV and 16.85 eV, and the products are rapidly frozen at approximately 5 K, the infrared spectrum of the resulting

Thermal Expansion Coefficients of Low-K Dielectric Films From Fourier Analysis of X-Ray Reflectivity

July 1, 2000

Author(s)

Charles E. Bouldin, William E. Wallace, G W. Lynn, S C. Roth, Wen-Li Wu

We determine the thermal expansion coefficient of a fluorinated poly (arylene ether) low-k dielectric film using Fourier analysis of x-ray reflectivity data. The approach is similar to that used in Fourier analysis of x-ray absorption fine structure. The

Thermophysical Properties of Gaseous HBr and BCl 3 from Speed-of-Sound Measurements

July 1, 2000

Author(s)

John J. Hurly

The speed of sound in gaseous hydrogen bromide (HBr) and boron trichloride (BCl^3^) was measured using a highly precise acoustic resonance technique. The HBr speed-of-sound measurements span the temperature range 230 K to 440 K and the pressure range from

Time-Base Setting Dependence of Pulse Parameters Using High-bandwidth Digital Sampling Oscilloscopes

July 1, 2000

Author(s)

Nicholas Paulter, Donald R. Larson

Errors in the time-base of digital sampling oscilloscopes (samplers) will cause errors in the reported pulse parameters of the sampler-acquired waveforms and will also contribute to the uncertainty estimate for these parameters. We present the results of

Toroidal Cross-Capacitor for Measuring the Dielectric Constant of Gases

July 1, 2000

Author(s)

T J. Buckley, J O. Hamelin, Michael R. Moldover

We describe toroidal cross capacitors built to accurately measure the dielectric constant of gases. We tested the capacitors by measuring the dielectric polarizability of helium and argon at 7 and 50 degrees C at pressures up to 3 MPa. For helium, the

Transverse compressive stress effects on the critical current of Bi-2223/Ag tapes reinforced with pure Ag and oxide-dispersion-strengthened AgS.

July 1, 2000

Author(s)

E Bray, John (Jack) W. Ekin, Cameron C. Clickner, L J. Masur

We have measured the effect of transverse compressive stress on the critical current of two similar sets of Bi 2Sr 2Ca 2Cu 3O X (Bi-2223) tapes in a direct comparison between tapes reinforced with pure Ag and oxide-dispersion-strengthened (ODS) Ag. The

Treasure of the Past: II. The Atomic Weight of Bromine

July 1, 2000

Author(s)

Alan Weber

A considerable amount of work has been done in order to determine the atomic weight of bromine and the oft-repeated comparison of the atomic weights of silver and bromine makes it seem that this ratio is known with considerable accuracy. The value accepted

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