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NIST Authors in Bold

Displaying 476 - 500 of 1513

NIST Nanotechnology Environmental, Health, and Safety Research Program: 20092016

November 27, 2018
Author(s)
Debra L. Kaiser, Vincent A. Hackley
In response to needs of a government-wide initiative in nanotechnology led by a subcommittee within the White House’s Office of Science and Technology Policy, NIST established a nanotechnology environmental, health, and safety (nano-EHS) research program

Predictive Model Markup Language (PMML) Representation of Bayesian Networks: An Application in Manufacturing

October 2, 2018
Author(s)
Saideep Nannapaneni, Anantha Narayanan Narayanan, Ronay Ak, David Lechevalier, Thurston Sexton, Sankaran Mahadevan, Yung-Tsun Lee
Bayesian networks (BNs) represent a promising approach for the aggregation of multiple uncertainty sources in manufacturing networks and other engineering systems for the purposes of uncertainty quantification, risk analysis, and quality control. A

Spherical Test Objects for Hand-held Metal Detector Characterization

September 12, 2018
Author(s)
Nicholas G. Paulter Jr., Donald R. Larson, John A. Ely
Measuring the detection performance of metal detectors (hand-worn, hand-held, and walk-through models) is based on the observation of an alarm indication (light, sound, vibration) given by the metal detector when a threat or test object is present. These

The Industrial Ontologies Foundry Proof-of-Concept Project

August 26, 2018
Author(s)
Boonserm Kulvatunyou, Evan K. Wallace, Dimitris Kiritsis, Barry Smith, Chris Will
The current industrial revolution is said to be driven by the digitization of manu-facturing that exploits connected information across all aspects of manufacturing. Standards have been recognized as an important enabler. Ontology is the next generation

A reference high-pressure CO2 adsorption isotherm for ammonium ZSM-5 zeolite: results of an interlaboratory study

July 26, 2018
Author(s)
Huong Giang T. Nguyen, Laura Espinal, Roger D. van Zee, Matthias Thommes, Blaza Toman, Sterlin Hudson, Enzo Mangano, Stefano Brandani, Katie Cychosz, Pieter Bertier, Feng Yang, Bernhard Krooss, Rebecca Siegelman, Jeffrey Long, Yoko Nakada, Kazu Nakai, Armin Ebner, James Ritter, Aaron Moran, Orhan Talu, Yi Huang, Krista Walton, Pierre Billemont, Guy de Weireld
This paper reports the results of an international interlaboratory study led by the National Institute of Standards and Technology (NIST) on the measurement of high-pressure surface excess carbon dioxide adsorption isotherms on NIST Reference Material RM

10 T? and 100 T? Resistance Comparison between NIST and AIST

July 9, 2018
Author(s)
Dean G. Jarrett, Takehiko Oe, Nobu Kaneko, Shamith U. Payagala
We report the results of a comparison of 10 TΩ and 100 TΩ high resistance standards between the National Institute of Standards and Technology (NIST) and the National Institute for Advanced Industrial Science and Technology (AIST). Three standard resistors
Displaying 476 - 500 of 1513
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