U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 46151 - 46175 of 73929

Interactive Training Through Knowledge Navigation

January 5, 2001
Author(s)
Howard T. Moncarz
This paper describes the initiation of our project to study three-dimensional navigation through manufacturing knowledge domains suitable for training. In summary we are organizing and representing knowledge from the NIST Manufacturing Engineering

An HLLC-Type Approximate Riemann Solver for Ideal Magnetohydrodynamics

January 2, 2001
Author(s)
Katharine F. Gurski
This paper presents a new solver based on the HLLC (Harten-Lax-van Leer-contact wave) approximate nonlinear Riemann solver for gas dynamics for the ideal magnetohydrodynamics (MHD) equations written in conservation form. It is shown how this solver also

'Supercritical Water' Density Effects on the Rate of Isopropanol Dehydration

January 1, 2001
Author(s)
V I. Anikeev, Jeffrey A. Manion, A Ermakova
A new experimental procedure for studying the kinetics and thermodynamics of chemical reactions in supercritical fluids-solvents was suggested. The kinetics and mechanism of the dehydration of 2-propanol in supercritical water in a closed reactor were

A Careful Consideration of the Calibration Concept

January 1, 2001
Author(s)
Steven D. Phillips, William T. Estler, Theodore D. Doiron, K Eberhardt, M. Levenson
This paper is a detailed discussion of the technical aspects of the calibration process with emphasis on the definition of the measurand, the conditions under which the calibration results are valid, and the subsequent use of the calibration results in

A Comparison of Quantum-Mechanical Capacitance-Voltage Simulators

January 1, 2001
Author(s)
Curt A. Richter, Allen R. Hefner Jr., Eric M. Vogel
We have systematically compared the results of an extensive ensemble of the most advanced available quantum-mechanical capacitance-voltage simulation and analysis packages for a range of metal-oxide-semiconductor device parameters. While all have similar

A Decomposition-Based Approach to Layered Manufacturing

January 1, 2001
Author(s)
R Janardan, I Ilinkin, J Schwerdt, Miles E. Smid, J J. Majhi, Ram D. Sriram
This paper introduces a new approach for improving the performance and versatility of Layered Manufacturing (LM), which is an emerging technology that makes it possible to build physical prototypes of 3D parts directly from their CAD models using a
Displaying 46151 - 46175 of 73929
Was this page helpful?