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Displaying 46001 - 46025 of 74084

Measurement Considerations for the Determination of Central Plant Efficiency

January 1, 2001
Author(s)
Stephen J. Treado, Todd W. Snouffer
Concerns about maintaining optimum operating conditions for central plants in order to minimize energy usage and cost have highlighted the need for accurate measruements of electrical power, fluid flow and temperature chillers and boilers. In particular

Measurements of Static Noise in Display Images

January 1, 2001
Author(s)
John W. Roberts, Edward F. Kelley
The appearance of noise on a display is an important usability issue. Sources of noise include electrical interference, display driver artifacts, resampling artifacts, transmission artifacts, compression artifacts, and any intrinsic noise artifacts

Metallurgy Division 2000 Programs and Accomplishments

January 1, 2001
Author(s)
C A. Handwerker, Robert J. Schaefer
This report describes major programs and accomplishments of the Metallurgy Division of the NIST Materials Science and Engineering Laboratory (MSEL) in FY2000.The mission of the NIST Metallurgy Division is to provide critical leadership in the development

Method of Measuring Shunt Resistance of Photodiodes

January 1, 2001
Author(s)
P R. Thompson, Thomas C. Larason
A method of measuring the shunt resistance of diodes, specifically photodiodes, is examined and the procedure of how the method is implemented using LabVIEW is detailed. Rudimentary comparison with other accepted methods in industry is done. The

Microcalorimeter/EBIT Measurements of X-Ray Spectra of Highly Charged Ions

January 1, 2001
Author(s)
I Kink, J M. Laming, E Takacs, James V. Porto, John D. Gillaspy, E Silver, H. Schnopper, Simon R. Bandler, M Barbera, N Brickhouse, S Murray, D Landis, J. Beeman, E. E. Haller
Spectra of highly charged Ar, Kr, Xe and Fe ions, produced in an Electron Beam Ion Trap (EBIT), have been recorded in a broad x-ray energy band (0.2 keV to 10 keV) with a microcalorimeter detector. The first analysis of the Kr spectra has been completed

Micromagnetic Domain Structures of Nano-scale Nickel Dots

January 1, 2001
Author(s)
A Kunz
The magnetic domain structure of cylindrical nickel dots is found to be a function of dot diameter and stripe period of unpatterned films of like thickness. This study was completed using magnetic force microscopy, and Landau-Lifshitz Gilbert micromagnetic
Displaying 46001 - 46025 of 74084