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Displaying 44901 - 44925 of 74400

Reflectance Calibration Standard for Optical Discs

January 1, 2002
Author(s)
Xiao Tang, Jian Zheng
An accurate method for the determination of reflectance of reference discs has been developed at NIST. The discs can be used as a traceable industry standard in the calibration of optical disc testing equipment.

Research and Challenges in Applied Mechanics

January 1, 2002
Author(s)
K P. Chong, Martin Chiang
The United States Government pursues diligent funding of basic research because it confers a preferential economic advantage1. The National Science Foundation (NSF) and the National Institute of Standards and Technology (NIST) have supported basic research

Resonating torque microbalance for in situ measurements of ferromagnetic films

January 1, 2002
Author(s)
John M. Moreland, James A. Beall, Stephen E. Russek
We describe an instrument for in situ monitoring of the magnetic moment of a thin film during deposition with sub-monolayer sensitivity. The instrument measures the magnetic torque on a film as it is being deposited onto a microcantilever excited near its

Review: SQUID Multiplexers for Transition-Edge Sensors

January 1, 2002
Author(s)
Kent D. Irwin
We review the SQUID multiplexer schemes that are being developed to instrument large-format arrays of superconducting transition-edge sensors. We discuss the choice of an orthogonal basis set to represent the multiplexed signal (such as time or frequency)
Displaying 44901 - 44925 of 74400
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