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Displaying 38351 - 38375 of 73829

UML 2 Composition Model

October 1, 2004
Author(s)
Conrad E. Bock
The composition model in the Unified Modeling Language, version 2, is a major upgrade to the familiar black diamond composition of earlier versions. It supports connections between parts at the same level of decomposition, in addition to the usual part

Virtual Surface Calibration and Computational Uncertainty

October 1, 2004
Author(s)
Son H. Bui, Theodore V. Vorburger, Thomas B. Renegar
This paper presents the development of a virtual surface calibration database for parameter evaluation and algorithm verification. The database runs from a web site at the National Institute of Standards and Technology (NIST), USA. Companies, universities

What Do the Specifications Mean?

October 1, 2004
Author(s)
Edward F. Kelley
Specifications and "specsmanship" continue to confuse people despite the fact that a solid metrological basis exists for communicating display performance. We review some of the misunderstandings encountered in the display industry and encourage uniformity

X-Ray Imaging with Ultra-Small-Angle X-Ray Scattering as a Contrast Mechanism

October 1, 2004
Author(s)
Lyle E. Levine, Gabrielle G. Long
A new transmission X-ray imaging technique based upon ultra-small-angle X-ray scattering (USAXS) is described. Images are formed from angle-filtered X-rays that are scattered by electron density variations within the sample. Stereo USAXS imaging provides

XML Schema Design Quality Test Requirements

October 1, 2004
Author(s)
Boonserm Kulvatunyou, KC Morris
Consistent design of XML schema within an organization or single integration project can reduce the number and the severity of interoperability problems. In addition, this consistency makes the XML schema easier to extend, understand, implement, and

The era of coherent optical frequency references

September 29, 2004
Author(s)
Leo W. Hollberg, Christopher W. Oates, Scott Diddams, G Wilpers, A Bartels, C Hoyt, Zeb Barber
The past four years have shown a dramatic improvement in the performance of optical frequency references and in the methods by which they are calibrated and utilized. These revolutionary changes result from better stabilized lasers that probe narrow

Wear and Mechanical Properties of Nano-Silica-Fused Whisker Composites

September 28, 2004
Author(s)
Hockin D. Xu, Janet Quinn, Anthony A. Giuseppetti
This study aimed to improve the composite wear resistance via reinforcement using nano-silica-fused whiskers, and to examine the relationships between wear and mechanical properties. Nano-silica particles were fused onto silicon nitride whiskers at 800 C

A Test Methodology for Multiple Sensor Multiple Criteria Alarms

September 26, 2004
Author(s)
Thomas G. Cleary
Multiple sensor-multiple criteria fire alarms hold promise for improving fire detection by both increasing sensitivity to fire while decreasing nuisance alarms. Eventually, to provide a fair assessment of performance, some type of uniform testing protocol

Retrieving Noisy Text

September 26, 2004
Author(s)
Ellen M. Voorhees, John S. Garofolo
Two tracks within TREC have examined the problem of retrieving noisy documents---documents whose content is not necessarily a faithful representation of the author's intent. The confusion track tested the ability of system to retrieve documents that were

Nonlinear Modeling of Tunnel Diode Detectors

September 24, 2004
Author(s)
Dave K. Walker, Kevin Coakley, Jolene Splett
We investigate the sensitivity and nonlinear properties of a tunnel diode microwave detector as functions of the input power and the load impedance presented at the detector's output. We compare the two-tone method estimate of nonlinearity with precise

Standard Radiometers and Targets for Microwave Remote Sensing

September 24, 2004
Author(s)
James P. Randa, Amanda Cox, Dave K. Walker, Michael H. Francis, Katherine MacReynolds, Jeffrey R. Guerrieri
We describe the NIST effort to develop brightness-temperature standards for microwave and millimeter-wave frequencies. Results of preliminary measurements at 26 GHz are presented.

Ensuring High Quality Data Transfer Standards

September 23, 2004
Author(s)
Arthur Griesser
Quality data transfer standards are necessary for effective communication between equipment provided by different vendors. Like other complex activities, standards benefit strongly from careful requirements definition and analysis. This presentation

Measuring the Performance of XML-Based Data Standards

September 23, 2004
Author(s)
Eric D. Simmon, Gino Crispieri
The semiconductor fabrication plant floor is a constantly changing environment. As equipment and fabrication process complexity increases, larger quantities of data are being generated, transferred and processed. New data encoding standards are being
Displaying 38351 - 38375 of 73829
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