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Displaying 37451 - 37475 of 143797

Does Your SEM Really Tell the Truth? Part 2

November 1, 2013
Author(s)
Michael T. Postek, Andras Vladar, Premsagar P. Kavuri
The scanning electron microscope (SEM) has gone through a tremendous evolution to become indispensable for many and diverse scientific and industrial applications. The first paper in this series, discussed some of the issues related to signal generation in

Electronic Authentication Guideline:

November 1, 2013
Author(s)
William E. Burr, Donna F. Dodson, Elaine M. Newton, Ray A. Perlner, W. Timothy Polk, Sarbari Gupta, Ebad A. Nabbus

High-resolution K-shell spectra from laser excited molybdenum plasma

November 1, 2013
Author(s)
Lawrence T. Hudson, C.I Szabo, P Indelicatio, John F. Seely, T Ma
X-ray spectra from Molybdenum plasmas were recorded by a Cauchois-type cylindrically bent Transmission Crystal Spectrometer (TCS). The absolutely calibrated spectrometer provides an unprecedented resolution of inner shell transitions (K x-ray radiation)

On the Use of Phase Data When Conducting an Extrapolation Measurement

November 1, 2013
Author(s)
Jason B. Coder, David R. Novotny, Michael H. Francis, Jeffrey R. Guerrieri
The extrapolation measurement technique has been used with the three antenna method for more than 40 years, to determine absolute antenna gain and polarization data. The critical part of the extrapolation technique is an insertion loss measurement that is
Displaying 37451 - 37475 of 143797
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