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Displaying 33826 - 33850 of 74408

Optoelectronics Division Programs, Activities, and Accomplishments

January 1, 2007
Author(s)
Kent B. Rochford
The NIST Optoelectronics Division provides measurement technology, standards, and traceability for the optoelectronics industry. This document describes the programs, activities, and accomplishments of the Division during the 2006 fiscal year. It is

Program Review for Information Security Management Assistance (PRISMA)

January 1, 2007
Author(s)
Pauline Bowen, Richard L. Kissel
Several sources of guidance, policies, standards and legislative acts provide many requirements for the federal agencies when protecting entrusted information. Various assessments, reviews, and inspections are an outcome of these information security

Quantitative Surface Analysis of Fe-Ni Alloy Films by XPS, AES and SIMS

January 1, 2007
Author(s)
K J. Kim, D Moon, C J. Park, David S. Simons, J Greg Gillen, H Jin, H Kang
Quantitative surface analysis of Fe-Ni alloy thin films has been proposed as a new subject for a pilot study by the surface analysis working group of the Consultative Committee for Amount of Substance (CCQM). Three Fe-Ni alloy films with different

Random-Effects Model for Meta-analysis of Clinical Trials: An Update

January 1, 2007
Author(s)
Rebecca DerSimonian, Raghu N. Kacker
The random-effects model is a useful approach for meta-analysis of clinical studies. It explicitly accounts for the heterogeneity of studies through a statistical parameter representing the inter-study variation. We discuss several iterative and non
Displaying 33826 - 33850 of 74408
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