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Displaying 33176 - 33200 of 73697

Rheology of Concentrated Carbon Nanotube Suspensions

January 1, 2007
Author(s)
K HobbieE, J FryD
The rheological properties of non-Brownian carbon nanotube suspensions are measured over a range of nanotube volume fractions spanning the transition from semi-dilute to concentrated. The nanotubes are `sticky' and form a quiescent elastic network with a

Roundness Measurements Using the NIST Fiber Probe

January 1, 2007
Author(s)
Balasubramanian Muralikrishnan, Jack A. Stone Jr., John R. Stoup
We have described a fiber probe for dimensional measurement of micro-holes in the 2004 and 2006 ASPE annual meetings. In this abstract, we describe the adaptation of this probe for measuring roundness of tiny holes and knife edge apertures. In its current

SEMPA Imaging for Spintronics Applications

January 1, 2007
Author(s)
John Unguris, Daniel T. Pierce, Seok-Hwan Chung
Scanning Electron Microscopy with Polarization Analysis (SEMPA) provides high resolution (10 nm) magnetization images simultaneously with, but independent of, the topography. Such information is very useful in studying spintronics devices as illustrated by

Spin-Orbit Precession Damping in Transition Metal Ferromagnets

January 1, 2007
Author(s)
Keith Gilmore, Y Idzerda, Mark D. Stiles
We provide a simple explanation, based on an effective field, for the precession damping rate due to the spin-orbit interaction. Previous effective field treatments of spin-orbit damping include only variations of the state energies with respect to the

Stochastic Modeling and Estimation in a Neutron Lifetime Experiment

January 1, 2007
Author(s)
Yang G. L., Kevin Coakley
A team of researchers demonstrated at the National Institute of Standards and Technology Cold Neutron Research Facility for the first time that ultra cold neutrons can be confined in a magnetic trap filled with liquid helium. This technical breakthrough

Strain-Induced Grain Growth during Rapid Thermal Cycling of Aluminum Interconnects

January 1, 2007
Author(s)
Robert Keller, Roy H. Geiss, Nicholas Barbosa, Andrew Slifka, David T. Read
We demonstrate by use of automated electron backscatter diffraction (EBSD) the rapid growth of grains in non-passivated, sputtered Al-1Si interconnects during 200 Hz thermal cycling induced by alternating electric current. Mean grain diameters were
Displaying 33176 - 33200 of 73697
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