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Displaying 31726 - 31750 of 73461

SAMATE and Evaluating Static Analysis Tools

September 1, 2007
Author(s)
Paul E. Black
We give some background on the Software Assurance Metrics And Tool Evaluation (SAMATE) project and our decision to work on static source code security analyzers. We give our experience bringing government, vendors, and users together to develop a

Science based Information Metrology for Engineering Informatics

September 1, 2007
Author(s)
Sudarsan Rachuri
Engineering informatics is the discipline of creating, codifying (structure and behavior that is syntax and semantics), exchanging (interactions and sharing), processing (decision making), storing and retrieving (archive and access) the digital objects

Standardized Data Exchange of CAD Models with Design Intent

September 1, 2007
Author(s)
Junhwan Kim, Mike Pratt, Raj G. Iyer, Ram D. Sriram
Modern CAD systems generate feature-based product shape models with parameterization and constraints. Until recently, standards for CAD data exchange among different CAD systems were restricted to the exchange of pure shape information. These standards

Sustaining Engineering Informatics: Toward Methods and Metrics for Digital Curation

September 1, 2007
Author(s)
Joshua Lubell, Eswaran Subrahmanian, Mahesh Mani, Sudarsan Rachuri
Ensuring the long-term usability of engineering informatics (EI) artifacts is a challenge, particularly for products with longer life cycles than the computing hardware and software used for their design and manufacture. Addressing this challenge requires

Systematic Error of the Nose-to-Nose Sampling-Oscilloscope Calibration

September 1, 2007
Author(s)
Dylan Williams, Tracy S. Clement, Kate Remley, Paul D. Hale, F. Verbeyst
We use traceable swept-sine and electrooptic-sampling-system-based-sampling-oscilloscope calibrations to measure the systematic error of the nose-to-nose calibration, and compare the results to simulations. Our results show that the errors in the nose-to

The Helium Ion Microscope: A New Tool for Nanotechnology and Nanomanufacturing

September 1, 2007
Author(s)
Michael T. Postek, Andras Vladar, John A. Kramar, L A. Stern, John Notte, Sean McVey
Helium Ion Microscopy (HIM) is a new, potentially disruptive technology for nanotechnology and nanomanufacturing. This methodology presents a potentially revolutionary approach to imaging and measurements which has several potential advantages over the

The Potential of Highly Charged Ions: Possible Future Applications

September 1, 2007
Author(s)
John D. Gillaspy, Joshua M. Pomeroy, A C. Perrella, Holger Grube
This paper mirrors and provides references to an invited review talk delivered by the first author at the 13th International Conference on the Physics of Highly Charged Ions. It briefly updates and extends an earlier review given in 2001 [1].

Theory of Spin Transfer Torque

September 1, 2007
Author(s)
Mark D. Stiles
In magnetic multilayers, the spin polarized currents flowing between the magnetic layers can exert torques on the magnetizations of the layers when the magnetizations are not collinear. The theory of these spin transfer torques is developed in terms of

Three-Flat Test Solutions Including Mounting-Induced Deformations

September 1, 2007
Author(s)
Ulf Griesmann, Quandou (. Wang, Johannes A. Soons
We investigate three-flat calibration methods for circular flats, based on rotation symmetry and mirror symmetry, for absolute interferometric flatness measurements in the presence of deformations caused by the support mechanism for the flats, which are a
Displaying 31726 - 31750 of 73461
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