Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 30776 - 30800 of 73779

Micro-engineered local field control for high-sensitivity multi-spectral MRI

June 19, 2008
Author(s)
Gary Zabow, Stephen Dodd, John M. Moreland, Alan P. Koretsky
In recent years, biotechnology and biomedical research have benefited from the introduction of a variety of specialized nanoparticles whose well-defined, optically distinguishable signatures enable simultaneous tracking of numerous biological indicators

A Molecular Model for Toughening in Double-Network Hydrogels

June 18, 2008
Author(s)
Vijay Tirumala, Sanghun Lee, Taiki Tominaga, Eric K. Lin, Jian P. Gong, Paul D. Butler, Wen-Li Wu
A molecular mechanism is proposed for the toughness enhancement observed in double network (DN) hydrogels prepared from poly (2 acrylamido, 2-methyl, 1-propanesulfonicacid) (PAMPS) polyelectrolyte network and polyacrylamide (PAAm) linear polymer. It is an

Electron Trapping: An Unexpected Mechanism of NBTI and Its Implications

June 17, 2008
Author(s)
Jason P. Campbell, Kin P. Cheung, John S. Suehle, A Oates
We utilize fast-IdVg measurements to examine NBTI recovery over a time scale of 2usecs to 1000 seconds. The extracted DVTH and %GM degradation data clearly demonstrates the presence of hole as well as electron trapping and detrapping. The hole and electron

Surface Effects on the Elastic Modulus of Te Nanowires

June 17, 2008
Author(s)
Gheorghe Stan, Sergiy Krylyuk, Albert Davydov, Mark D. Vaudin, Leonid A. Bendersky, Robert F. Cook
Nondestructive elastic property measurements have been performed on Te nanowires with diameters in the range 20 150 nm. By using contact resonance atomic force microscopy, the elastic indentation modulus perpendicular to the prismatic facets of the

Flow Assurance in a Model Crude Oil: A Structural and Rheometric Study

June 16, 2008
Author(s)
E. Drabarek, Chris Muzny, G. Bryant, Howard J. Hanley
This report investigates how the technique of small angle neutron scattering (SANS) helps elucidate the phenomenon of wax deposition in a petroleum crude oil. Specifically, we report SANS data, supplemented by results from dynamic light scattering (DLS)

The Kirkwood-Buff Integrals for One-Component Liquids

June 16, 2008
Author(s)
Yedhud A. Ben-Naim
The Kirkwood-Buff integrals (KBIs) for one-component systems are calculated from either the pair correlation functions or from experimental macroscopic quantities. As in the case of mixtures, the KBIs provide important information on the local densities

Dual-CGH Interferometry Test for X-Ray Mirror Mandrels

June 15, 2008
Author(s)
Guangjun Gao, John Lehan, Ulf Griesmann
We describe a glancing-incidence interferometric double-pass test, based on a pair of computer generated holograms (CGHs), for mandrels used to fabricate x-ray mirrors for space-based x-ray telescopes. The design of the test and its realization are

Evaluation of Nonlinear Distortion in ADCs Using Multisines

June 15, 2008
Author(s)
Catherine A. Remley, Nuno Carvalho, Pedro Cruz
This paper characterizes nonlinear distortion in an analog-to-digital converter (ADC) when it is excited by representative communication signals having non-constant time-domain envelopes. The effect of subjecting the ADC to signals that present a range of

Third order Intermodulation Distortion in Film Bulk Acoustic Resonators at Resonance and Antiresonance

June 15, 2008
Author(s)
Eduard Rocas, Juan C. Collado Gomez, Jordi Mateu, Nathan D. Orloff, Alberto Padilla, Juan Callaghan, James C. Booth, Robert Aigner
This paper presents recent measurements and modeling of the third order intermodulation products of a Film Bulk Acoustic Resonator (FBAR), for a various values of frequency spacing between driving tones. The frequency dependence of voltage and current in

Design of a Turn-Key 10 V Programmable Josephson Voltage Standard System

June 13, 2008
Author(s)
Paul D. Dresselhaus, Mike Elsbury, Charles J. Burroughs, David I. Olaya, Samuel P. Benz, Norman F. Bergren, Robert E. Schwall, Zoya Popovic
NIST is designing a 10 V Programmable Josephson Voltage Standard (PJVS) system with an improved microwave design and arrays of stacked NbXSi1-x-barrier Josephson junctions. For this new design a ?ground-up? approach, was used which takes into account all

Electro-Thermal Simulation of a 100 A, 10 kV Half-Bridge SiC MOSFET/JBS Power Module

June 13, 2008
Author(s)
Tam H. Duong, Jose M. Ortiz, R. N. Raju, Allen R. Hefner Jr.
This paper presents the results from a parametric simulation study that was conducted to optimize the performance of 100 A, 10 kV, 20 kHz half-bridge SiC MOSFET/JBS power modules. The power modules are being developed by the DARPA WBGS-HPE Phase II program

Globalization of technology-based growth: the policy imperative

June 13, 2008
Author(s)
Gregory C. Tassey
The United States became the dominant technology-based economy after World War II and held that position for decades by accumulating a huge base of superior technical, physical, organizational, and marketing assets. However, the world is witnessing the

Multisine Signals for Wireless System Test and Design

June 13, 2008
Author(s)
Catherine A. Remley, Nuno Carvalho, Dominique Schreurs, Kevin Gard
We discuss the use of multisine test signals for system verification and model development in the laboratory. We highlight the utility of multisine excitation for test and verification of telecommunication systems, where nonlinear elements such as power

Thermal Network Component Models for 10 kV SiC Power Module Packages

June 13, 2008
Author(s)
Jose M. Ortiz, Madelaine H. Hernandez, Tam H. Duong, Scott G. Leslie, Allen R. Hefner Jr.
The DARPA WBGS-HPE program is developing 100 A, 10 kV SiC power modules to demonstrate the viability of a 2.75 MVA Solid State Power Substation that uses 10 kV, 20 kHz switching-capable devices. Thermal network component models for these modules are

Proceedings of the Static Analysis Workshop (SAW 2008)

June 12, 2008
Author(s)
Paul E. Black, Elizabeth N. Fong
Static Analysis Workshop (SAW 2008) was held on June 12, 2008 in Tucson, Arizona and was co-located with ACM SIGPLAN 2008 Conference on Programming Language Design and Implementation (PLDI 2008). This workshop followed Static Analysis Summit, held in 2006

Modeling and Simulation for Sustainable Manufacturing

June 11, 2008
Author(s)
Deogratias Kibira, Charles R. McLean
With increasing frequency the news media reports that the planet is warming, pollutants are contaminating the environment, energy costs are rising, and precious natural resources are dwindling. These reports are sounding an alarm that we need to change the

Usability and Biometrics: Ensuring Successful Biometric Systems

June 11, 2008
Author(s)
Mary F. Theofanos, Brian C. Stanton, Cari Wolfson
The National Institute of Standards and Technology (NIST)Visualization and Usability Gropu initiated a Usability and Biometrics effort to focus on the users and human factors of biometric systems. The goal of this effort has been to conduct research to
Displaying 30776 - 30800 of 73779
Was this page helpful?