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Displaying 27201 - 27225 of 73697

Low-Cost, High-Throughput, Automated Counting of Bacterial Colonies

January 5, 2010
Author(s)
Matthew L. Clarke, Robert L. Burton, A. N. Hill, Maritoni A. Litorja, Moon H. Nahm, Jeeseong Hwang
Research involving bacterial pathogens often requires enumeration of bacteria colonies. Here we present a low-cost, high-throughput colony counting system consisting of colony counting software and a consumer-grade digital camera or document scanner. We

NIST Time and Frequency Bulletin

January 5, 2010
Author(s)
Eyvon Petty
The Time and Frequency Bulletin provides information on performance of time scales and a variety of broadcasts (and related information) to users of the NIST services)

Nanoscale Measurements With the TSOM Optical Method

January 4, 2010
Author(s)
Ravikiran Attota
A novel through-focus scanning optical microscope (TSOM - pronounced as 'tee-som') technique that produces nanometer dimensional measurement sensitivity using a conventional optical microscope by analyzing images obtained at different focus positions will

SRM NIST Standard Reference Materials Catalog, January 2010

January 4, 2010
Author(s)
Regina R. Montgomery, Joan C. Sauerwein
NIST Standard Reference Materials (SRMs) are used by industry, government, and academia to ensure the highest quality measurements. This catalog lists over 1100 individual reference materials produced and sold by NIST, each with carefully assigned values

3-D Metallization by Damascene Electrodeposition

January 1, 2010
Author(s)
Thomas P. Moffat, Chang H. Lee, Daniel Josell
Electrodeposition is a key fabrication process used in the state-of-the-art multilevel Cu metallization of microelectronic interconnects from transistor to circuit board length scale. Recent electrochemical surface science and feature filling studies have

Accurate optical analysis of single molecule entrapment in nanoscale vesicles

January 1, 2010
Author(s)
Joseph E. Reiner, Andreas Jahn, Samuel M. Stavis, Michael J. Culbertson, Wyatt N. Vreeland, Daniel L. Burden, Jon C. Geist, Michael Gaitan
We present a non-destructive method to characterize low analyte concentrations in nanometer scale lipid vesicle formulations. Our method is based on the application of fluorescence fluctuation analysis (FFA) and multi-angle laser light scattering (MALLS)
Displaying 27201 - 27225 of 73697
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