Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 251 - 275 of 3122

A Review of the IEEE 1785 Standards for Rectangular Waveguides above 110 GHz

June 6, 2017
Author(s)
Ronald A. Ginley, Nick M. Ridler
A new series of standards has recently been published by IEEE defining waveguide for use at millimeter-wave and terahertz frequencies. The series comprises three standards covering different aspects of this technology: (i) frequency bands and waveguide

Comprehensive circuit model of auto-limiting superconductor devices and systems

May 31, 2017
Author(s)
Jordi Mateu, C Collado, A Hueltes, D Garcia-Pastor, R Perera, Nikhil M. Joshi, Xifeng Lu, Nate Orloff, Jim Booth
This paper presents a phenomenological equivalent circuit to model the phenomenon occurring when a section of superconducting transmission line transits from the superconductor to the normal state. This phenomenon allows the use of superconductors for the

Electric field metrology for SI traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vapor

May 24, 2017
Author(s)
Christopher L. Holloway, Matthew T. Simons, Joshua A. Gordon, Georg Raithel, dave Anderson
We investigate the relationship between the Rabi frequency ($\Ω_{RF}$, related to the applied electric field) and Autler-Townes (AT) splitting, when performing atom-based radio- frequency (RF) electric (E) field strength measurements using Rydberg states

3-Port Frequency Selective Absorptive Limiter

May 1, 2017
Author(s)
A Hueltes, Eduard Rocas, Carlos Collado, Jordi Mateu, D Garcia-Pastor, James Booth, Rafael P. Robles
This paper proposes a novel 3-port absorptive limiter for frequency selective circuits based on a similar configuration than a conventional 90º hybrid coupler. This circuit uses the switching features existing in common diode devices to changes between the

A Radio Frequency Radiation Reverberation Chamber Exposure System for Rodents

March 17, 2017
Author(s)
Perry F. Wilson, John M. Ladbury, Galen H. Koepke, Capstick Myles, Niels Kuster, Sven Kuhn, Veronica Berdinas-Torres, Yijian Gong, David McCormick, James Gauger, Ronald Melnick
In this paper we present the novel design features, their technical implementation, and an evaluation of the radio frequency (RF) exposure systems developed for the National Toxicology Program (NTP) of the National Institute of Environmental Health

An All-Metal, 3-D-Printed CubeSat Feed Horn: An assessment of performance conducted at 118.7503 GHz using a robotic antenna range

February 20, 2017
Author(s)
Josh Gordon, David R. Novotny, Ronald C. Wittmann, Michael Francis, Jeffrey R. Guerrieri, Alexandra Curtin, Miranda L. Butler, Albin Gasiewski, Lavanya Periasamy
Three-dimensional (3-D) printing is finding applications across many areas and may be a useful technology for antenna fabrication for cube satellites (CubeSats). However, the quality of an antenna produced using 3-D printing must be considered if this

Vector-Network-Analyzer Calibration Using Line and Multiple Coplanar-Waveguide Offset Reflects

December 9, 2016
Author(s)
Arkadiusz C. Lewandowski, Wojciech Wiatr, Dazhen Gu, Nate Orloff, Thomas Mitchell (Mitch) Wallis, Pavel Kabos
We present the application of our newly developed multi-reflect-thru technique to vector-network-analyzer calibration in the on-wafer environment. This technique uses a set of highly-reflective one-port devices, referred to as offset-reflects, and a single

Kicking the Tires of the NIST Microwave Uncertainty Framework,

December 8, 2016
Author(s)
Ronald A. Ginley
As with anything new, especially metrology tools, you want to know how good the new tool is. This is generally done through comparisons with existing systems. In this paper such a comparison is described. The new NIST method of processing measurements and
Displaying 251 - 275 of 3122
Was this page helpful?