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Search Publications

NIST Authors in Bold

Displaying 4451 - 4475 of 13217

100 Years of Optical Science and Metrology at NIST

June 1, 2001
Author(s)
William R. Ott
… of the contributions of some of the pioneers from NBS/NIST in optical science and metrology, ranging from William … to William Phillips, who received the Nobel Prize in Physics in 1997 for his research on the laser cooling and trapping of …

A Methodology for Integrating Sensor Feedback in Machine Tool Controllers

June 30, 1992
Author(s)
Frederick M. Proctor, John L. Michaloski, Thomas Kramer
… by researchers at the National Institute of Standards and Technology, and has been implemented on a variety of computing platforms for manufacturing and vehicle control applications. A fundamental … nested control loops, which incorporate sensory feedback in a hierarchy whose cycle times decrease in frequency as …

On Deep Reinforcement Learning Security for Industrial Internet of Things

February 15, 2021
Author(s)
Xing Liu, Wei Yu, Fan Liang, David W. Griffith, Nada T. Golmie
… of Things (IIoT), also known as Industry 4.0, empowers manufacturing and production processes by leveraging … automation and Internet of Things (IoT) technologies. In IIoT, the information communication technologies enabled … Reinforcement Learning (DRL), are viable for assisting in automated control of complex IIoT systems. Despite …

Sensing Trace Amounts of Nitro-Aromatic Explosives using Nanowire-Nanocluster Hybrids

August 1, 2012
Author(s)
Geetha G. Aluri, Abhishek Motayed, Albert Davydov, Vladimir P. Oleshko, Kristine A. Bertness, Norman A. Sanford
… are photomodulated, i.e., they responded to analytes only in the presence of ultra violet (UV) light. This paper … (TNT) concentrations as low as 500 pmol/mol (ppt) in air and dinitrobenzene (DNB) concentrations as low as 10 … compounds like toluene. Integration of this nano-scale technology could lead to tiny, highly sensitive, selective, …

Emergency First Responder Respirator Thermal Characteristics: Workshop Proceedings

June 29, 2011
Author(s)
Amy E. Mensch, Nelson P. Bryner
… performance. The goals of the workshop were defined in two parts: 1) Clarify baseline information, including the … to discuss performance needs and research priorities in smaller groups. Suggested topics for discussion included: … fire fighter environment, performance of current and new technology, development of representative and realistic …

Benefits and Costs of Research: A Case Study of Improved Service Life Prediction

October 15, 2009
Author(s)
Robert E. Chapman, David T. Butry, Allison L. Huang, Douglas S. Thomas
… is an interdisciplinary research effort within BFRL in collaboration with the private sector, other federal … and deployment effort illustrates how to apply in practice a series of standardized methods to evaluate and … of alternative research investments. It is presented in sufficient detail to understand the basis for the economic …

Implementation of a Reference Measurement System Using CD-AFM

May 1, 2003
Author(s)
Ronald G. Dixson, Theodore V. Vorburger, Angela Guerry, Marylyn H. Bennett, B Bunday
… (ISMT) and the National Institute of Standards and Technology (NIST) are working together to improve the … of atomic force microscope (AFM) dimensional metrology in semiconductor manufacturing. The rapid pace of technological change in the …

Monoclonal Antibody Therapeutics: The Need for Biopharmaceutical Reference Materials

December 16, 2014
Author(s)
John E. Schiel, Anthony Mire-Sluis, Darryl Davis
… Therapeutic monoclonal antibodies can be thought of in a similar light as they harness the highly evolved … advent of mammalian cell culture, process, and formulation technology. At the same time, state-of-the-art and emerging … suitability verified with trending and comparability to in-house product specific reference standards. This mechanism …

Photomask Metrology in the Era of Neolithography

February 1, 1997
Author(s)
James E. Potzick
… scanning probe microscopes can present serious problems in modeling, throughput, and accuracy. Accordingly, photomask metrology must be examined in the larger context of mask design, specification, … mask features may not always be measured directly as in the past. Instead, their optical effects can be measured …

Using Security Configuration Checklists and the National Checklist Program

May 25, 2011
Author(s)
Shirley M. Radack
… This bulletin summarizes the information presented in NIST Special Publication (SP) 800-70 Rev. 2, National … Recommendations of the National Institute of Standards and Technology. The publication was written by Stephen D. Quinn … Souppaya of the National Institute of Standards and Technology (NIST), and by Melanie Cook and Karen Scarfone of …

Towards a Digital Twin of a Robot Workcell: Standards and Methods

October 28, 2024
Author(s)
Deogratias Kibira, Guodong Shao, Rishabh Venketesh
… standard provides a guideline for building a digital twin in manufacturing. The MTConnect standard provides a mechanism … The workcell is represented by physical component models in the virtual world. The result of this research shows that …

BUILDING A DIGITAL TWIN OF AN AUTOMATED ROBOT WORKCELL

May 26, 2023
Author(s)
Deogratias Kibira, Guodong Shao, Rishabh Venketesh
… Building a digital twin of a manufacturing system can positively impact its performance … to industries seeking to build digital twins for their manufacturing assets. …

Measurement Traceability and Quality Assurance in a Nanomanufacturing Environment

March 8, 2011
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Aaron Cordes, Benjamin Bunday, John Allgair
… A key requirement for nano-manufacturing is maintaining acceptable traceability of … but most entail the use of calibrated artifacts. In an environment where different types of products are … to maintain traceability across different products mix. In this paper we present some of the work we have done in …

Measurement Traceability and Quality Assurance in a Nanomanufacturing Environment

September 25, 2009
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Aaron Cordes, Benjamin Bunday, John Allgair
… A key requirement for nano-manufacturing is maintaining acceptable traceability of … but most entail the use of calibrated artifacts. In an environment where different types of products are … to maintain traceability across different products mix. In this paper we present some of the work we have done in …

Some Considerations for a Measurement Strategy for Circular Features

January 1, 1994
Author(s)
Howard H. Harary, C Buchard, P L heritier, J Dufraigne, P Chollet
… we conducted a survey of the processes for making holes by manufacturing a set of test parts using ten different … and quality assurance using coordinate measuring machines in industry. The least-squares radii and center position of …

Procedures for the Traceability of High Resistance Standards Using a Teraohmmeter

August 1, 2008
Author(s)
Dean G. Jarrett, Marlin E. Kraft, Isabel Castro, Brett Degler, Mark Evans
… The Metrology of the Ohm Project in the Quantum Electrical Metrology Division (QEMD) at the National Institute of Standards and Technology (NIST) routinely disseminates the U. S. … resistors and current shunts of nominal decade values in the range 10 5 Ohm to 1012 Ohm provide NIST customers with …

Accurate Unsupervised Photon Counting from Transition Edge Sensor Signals

September 5, 2025
Author(s)
Nicolas Dalbec-Constant, Guillaume Thekkadath, Duncan England, Thomas Gerrits, Nicolas Quesada
… detectors fundamental for accessing quantum advantages in information processing, communication and metrology. We … within local structures, aiming to increase confidence in assigning photon numbers. Finally, we demonstrate the … Quantum Science and Technology …

Dynamical structure factor from weak measurements

June 25, 2025
Author(s)
Emine Altuntas, Rosaria Gabriella Lena, Stuart Flannigan, Ian Spielman, Andrew Daley
… Much of our knowledge of quantum systems is encapsulated in the expectation value of Hermitian operators, … Quantum Science and Technology …

Ratchet Loading and Multi-Ensemble Operation in an Optical Lattice Clock

August 8, 2024
Author(s)
Youssef Hassan, Takumi Kobayashi, Tobias Bothwell, Jacob Siegel, Benjamin Hunt, Kyle Beloy, Kurt Gibble, Tanner Grogan, Andrew Ludlow
… over the spatial distribution of ultra-cold atoms confined in an optical lattice. The control is facilitated through a … load an extended (5-mm) atomic sample with uniform density in an optical lattice clock, reducing atomic interactions and … Quantum Science and Technology …
Displaying 4451 - 4475 of 13217
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