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NIST Authors in Bold

Displaying 3926 - 3950 of 4199

SEM imaging of ultra-high aspect ratio hole features

March 29, 2012
Author(s)
John S. Villarrubia, Aron Cepler, Benjamin D. Bunday, Bradley Thiel
In-line, non-destructive process control metrology of high aspect ratio (HAR) holes and trenches has long been a known gap in metrology. Imaging the bottoms of at-node size beyond 10:1 AR contact holes in oxide has not yet been demonstrated. Nevertheless

Applications of Cross-Correlation Functions

April 14, 2010
Author(s)
Theodore V. Vorburger, Jun-Feng Song, Wei Chu, Li Ma, Xiaoyu A. Zheng, Thomas B. Renegar, Son H. Bui
We describe several examples where we use cross-correlation functions to quantify the similarity of 2D surface profiles or of 3D surface topography images. The applications have included 1) the manufacture of Standard Reference Material (SRM) bullets and

Self-Assembled Porphyrinic Materials on Surfaces

October 16, 2008
Author(s)
J Batteas
For the foreseeable future, the vast majority of commercial electronics, photonics, and other devices will be in the solid state and incorporated onto or into a substrate though there are substantial efforts to change this paradigm (1). To date, most of

Power Loading Effects in Precision 1 Ohm Resistors

August 1, 2008
Author(s)
George R. Jones, Randolph E. Elmquist
Five manganin alloy Thomas-type 1 Ohm resistors serve as primary working standards at the National Institute of Standards and Technology (NIST) in the precision potentiometer direct current comparator (DCC) system used for special 1 Ohm customer

Improving the Reliability of VOC Emissions Testing of Building Products

October 1, 2007
Author(s)
Cynthia H. Reed, Andrew K. Persily, Steven J. Nabinger, John C. Little, Steven Cox
Manufacturers of building materials and furnishings are increasingly using emissions chamber testing to demonstrate low volatile organic compound (VOC) emissions from their products and to qualify for low-emitting certification and sustainable labeling

Smart Machining Systems: Issues and Research Trends

November 1, 2005
Author(s)
Laurent Deshayes, Lawrence A. Welsch, Alkan Donmez, Robert W. Ivester, David E. Gilsinn, Richard L. Rhorer, Eric P. Whitenton, Florian Potra
… to changes in demand (just in time); realizing rapid manufacturing; and, providing data on an as needed basis. …

Healthcare Strategic Focus Area: Clinical Informatics

September 1, 2005
Author(s)
Conrad Bock, Lisa Carnahan, Steven J. Fenves, Michael Gruninger, V Kashyap, Bettijoyce B. Lide, Jim G. Nell, Ravi S. Raman, Ram D. Sriram
… interest to NIST?s Information Technology (ITL) and Manufacturing Engineering Laboratories (MEL): ? electronic …
Displaying 3926 - 3950 of 4199
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