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Displaying 3926 - 3950 of 4212

Nanotribology: the Link to Macrotribology

February 19, 2017
Author(s)
Stephen M. Hsu
… blossom into untold technologies in medicine, health-care, manufacturing, microelectronics, aerospace,informatics. …

The Canonical Robot Command Language (CRCL)

August 1, 2016
Author(s)
Frederick M. Proctor, Stephen B. Balakirsky, Zeid Kootbally, Thomas R. Kramer, Craig I. Schlenoff, William P. Shackleford
Industrial robots can perform motion with sub-millimeter repeatability when programmed using the teach-and-playback method. While effective, this method requires significant up-front time, tying up the robot and a person during the teaching phase. Off-line

The I/O transform of a chemical sensor

March 14, 2016
Author(s)
Nalin Katta, Douglas C. Meier, Kurt D. Benkstein, Stephen Semancik, Baranidharan Raman
A number of sensing technologies using a variety of transduction principles have been proposed for the purpose of non-invasive chemical sensing. A fundamental problem common to all sensing technologies is determining what features of the transducer's

Calibration and Measurement Procedures for a High Magnification Thermal Camera

January 8, 2016
Author(s)
Brandon M. Lane, Eric P. Whitenton
Infrared thermography is a relatively mature measurement science, however systematic evaluation of measurement uncertainty for multi-point measurement (an infrared focal plane array) is very limited, or, does not follow uncertainty evaluation guidelines

SEM imaging of ultra-high aspect ratio hole features

March 29, 2012
Author(s)
John S. Villarrubia, Aron Cepler, Benjamin D. Bunday, Bradley Thiel
In-line, non-destructive process control metrology of high aspect ratio (HAR) holes and trenches has long been a known gap in metrology. Imaging the bottoms of at-node size beyond 10:1 AR contact holes in oxide has not yet been demonstrated. Nevertheless

Applications of Cross-Correlation Functions

April 14, 2010
Author(s)
Theodore V. Vorburger, Jun-Feng Song, Wei Chu, Li Ma, Xiaoyu A. Zheng, Thomas B. Renegar, Son H. Bui
We describe several examples where we use cross-correlation functions to quantify the similarity of 2D surface profiles or of 3D surface topography images. The applications have included 1) the manufacture of Standard Reference Material (SRM) bullets and
Displaying 3926 - 3950 of 4212
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